2021 16th European Microwave Integrated Circuits Conference (EuMIC) 2022
DOI: 10.23919/eumic50153.2022.9783713
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Analysis of the Relaxed Contacted-Poly-Pitch Effect on the RF Performance of Strained-SiGe-Channel p-FETs in 22nm FDSOI Technology

Quang Huy Le
1
,
Dang Khoa Huynh
2
,
Steffen Lehmann
3
et al.
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