Impact of Off-State Stress on SiGe-channel p-FETs in 22nm FDSOI under Large-Signal Operation

Huynh, Dang Khoa; Le, Quang Huy; Lehmann, Steffen; Zhao, Zhixing; Bossu, Germain; Arfaoui, Wafa; Kämpfe, Thomas; Rudolph, Matthias

doi:10.23919/eumic58042.2023.10288886

2023 18th European Microwave Integrated Circuits Conference (EuMIC) 2023

DOI: 10.23919/eumic58042.2023.10288886

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Impact of Off-State Stress on SiGe-channel p-FETs in 22nm FDSOI under Large-Signal Operation

Dang Khoa Huynh,

Quang Huy Le,

Steffen Lehmann

et al.

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Impact of Off-State Stress on SiGe-channel p-FETs in 22nm FDSOI under Large-Signal Operation

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References 9 publications

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