2006
DOI: 10.1002/pssc.200565393
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Analysis of the local structure of AlN:Mn using X‐ray absorption fine structure measurements

Abstract: The local structure around the Mn atoms in MOCVD-grown AlN:Mn films which show Mn-related redorange photoluminescence with a 600nm-peak at room temperature was investigated using the X-ray absorption fine structure (XAFS) measurements. We found that Mn atoms occupy Al lattice sites in the AlN film and that the Mn ions have a charge between +2 and +3. From these results, we think that the redorange luminescence is caused by the transition of d-electrons in the Mn ions.1 Introduction Rare-earth doped AlN is a pr… Show more

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Cited by 15 publications
(11 citation statements)
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“…When Mn is accommodated in the tetrahedral structure, its emission spectrum exhibits green luminescence in oxide phosphors. On the other hand, orange emission is observed in AlN:Mn when Mn is at the tetrahedral site [25]. This suggests there is no preferential coordination with nitrogen around Mn in g-AlON as observed in the XANES spectra.…”
Section: Resultsmentioning
confidence: 81%
“…When Mn is accommodated in the tetrahedral structure, its emission spectrum exhibits green luminescence in oxide phosphors. On the other hand, orange emission is observed in AlN:Mn when Mn is at the tetrahedral site [25]. This suggests there is no preferential coordination with nitrogen around Mn in g-AlON as observed in the XANES spectra.…”
Section: Resultsmentioning
confidence: 81%
“…As to the origin of this emission, on the other hand, it is sill controversial. recently found that the Mn ions have a valence between 2+ and 3+ from the analysis using an X-ray absorption fine structure measurement [9]. Further studies are required to elucidate the origin of the emission.…”
Section: Resultsmentioning
confidence: 98%
“…Photoluminescence bands near 2 eV were observed earlier in AlN with below-bandgap excitation [8][9][10][11][12][13]. The bands were assigned to V Al -O N complexes [8], V N -Al i complexes [11], Mn Al or Cr Al impurities [12,13]. To characterize the 2 eV PL band we have performed temperaturedependent and time-resolved PL studies of AlN samples grown by molecular beam epitaxy at different conditions.…”
Section: Introductionmentioning
confidence: 98%