2010
DOI: 10.1016/j.mee.2009.05.012
|View full text |Cite
|
Sign up to set email alerts
|

Analysis of electronic parameters and interface states of boron dispersed triethanolamine/p-Si structure by AFM, I–V, C–V–f and G/ω–V–f techniques

Abstract: a b s t r a c tThe electronic parameters and interface state properties of boron dispersed triethanolamine/p-Si structure have been investigated by atomic force microscopy, I-V, C-V-f and G/x-V-f techniques. The surface topography and phase image of the TEA-B film deposited onto p-Si substrate were analyzed by atomic force microscopy. The atomic force microscopy results show a homogenous distribution of boron particles in triethanolamine film. The electronic parameters (barrier height, ideality factor and aver… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

0
10
0
1

Year Published

2010
2010
2021
2021

Publication Types

Select...
9

Relationship

1
8

Authors

Journals

citations
Cited by 43 publications
(11 citation statements)
references
References 16 publications
0
10
0
1
Order By: Relevance
“…The E g optical band gap of ZnO film was determined from curve of (F(R)h /t) 2 vs. h and was found to be 3.22 eV. The optical band gap of ZnO studied is lower than that of undoped ZnO materials obtained by various methods [31,32]. This suggests that the optical band gap of ZnO semiconductor changes with respect to synthesis method used.…”
Section: Determination Of Optical Band Gap Of the Zno Filmmentioning
confidence: 92%
“…The E g optical band gap of ZnO film was determined from curve of (F(R)h /t) 2 vs. h and was found to be 3.22 eV. The optical band gap of ZnO studied is lower than that of undoped ZnO materials obtained by various methods [31,32]. This suggests that the optical band gap of ZnO semiconductor changes with respect to synthesis method used.…”
Section: Determination Of Optical Band Gap Of the Zno Filmmentioning
confidence: 92%
“…The decrease in the capacitance at high frequencies depends on the ability of the charge carriers to follow the applied alternating current (AC) signal. If the C-V measurements were performed at sufficiently higher frequencies, the charge at the interface could not follow the AC sig- nal [25]. It is seen in the C-V plots that these curves have a peak in low frequency measurements.…”
Section: Resultsmentioning
confidence: 98%
“…In this technique, an organic interfacial layer is inserted between inorganic semiconductor and metal. As they can be applied to various areas like solar cells and Schottky diodes, there has been a growing interest in polymers such as poly(4-vinyl phenol), polyaniline, polyvinyl alcohol (PVA), poly(alkylthiophene) polypyrrole, polythiophene, and poly(3-hexylthiophene) [7][8][9][10][11][12][13][14][15][16][17][18]. In polymers, we find local free-volume holes or cavities of atomic and molecular dimensions, which may be the result of irregular packing of the molecules in amorphous phase (static and preexisting holes) and molecular relaxation of polymer chains and terminal ends (dynamic and transient holes).…”
Section: Introductionmentioning
confidence: 99%