Analog circuit fault diagnosis based on sensitivity computation and functional testing

Slamani, M.; Kaminska, Bożena

doi:10.1109/54.124515

Cited by 165 publications

(50 citation statements)

References 13 publications

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“…FAULT DIAGNOSIS Fault diagnosis using sensitivity of output to circuit parameters has been investigated in the literature [2], [34]. We have extended that approach exploiting the sensitivity of polynomial coefficients to circuit parameters [33].…”

Section: Resultsmentioning

confidence: 99%

High sensitivity test signatures for unconventional analog circuit test paradigms

Sindia

Agrawal

2013

2013 IEEE International Test Conference (ITC)

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Abstract-A method of testing for parametric faults in analog circuits based on a polynomial representation of fault-free function of the circuit is presented. The response of the circuit under test (CUT) is estimated as a polynomial in the root mean square (RMS) magnitude of the applied input voltage at a relevant frequency or DC. The test then classifies the CUT as fault-free or faulty based upon a comparison of the estimated polynomial coefficients with those of the fault-free circuit. The test application needs very little augmentation of the circuit to make it testable as only output parameters are used for classification. The method is validated on an active elliptic filter and is shown to uncover parametric faults causing deviations as small as 5% from nominal values. Fault diagnosis based upon sensitivity of polynomial coefficients at relevant frequencies is discussed. Another type of circuit signatures in the form of probability moments of the output when test input is random noise are also proposed. It is shown that the sensitivity of either signature can be enhanced by a newly proposed nonlinear Vtransform. Finally, an adaptive test framework leveraging from these signatures and the transform technique is shown to improve defect level and yield loss.

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Section: Resultsmentioning

confidence: 99%

High sensitivity test signatures for unconventional analog circuit test paradigms

Sindia

Agrawal

2013

2013 IEEE International Test Conference (ITC)

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“…The 100 patterns for the CUT discrete elements parameters dispersed randomly in their tolerance regions δ DEV = ± 5% (set I) and for eight Table 4 CUT performance parameters estimation errors and their standard deviations assumed special cases with the one selected element value shifted from the nominal point and randomly determined other ones (set II) were tested during this experiment. The filter circuit performance parameters were calculated basing on the regression models found evolutionarily (22)(23)(24)(25)(26)(27)(28)(29)(30)(31). Finally, identically as in [31], the CUT pattern is classified into the good ones if all the tested performance parameters do not exceed the allowed tolerance absolute deviation ± | p i | from the nominal level specified and to the faulty ones otherwise ( Table 5).…”

Section: Examples Of Low-pass Filters Testingmentioning

confidence: 99%

“…Catastrophic fault detection method dedicated to nonlinear circuits was described in [29]; however, work [30] presents the technique dedicated to the diagnosis of spot defects. In works [24,26,27], the approaches based on sensitivity analysis for faulty element identification, test measurements ambiguity sets determination and optimal frequency of testing signal selection, respectively, may be found. The example solution for CUT functional correctness verifying by investigating voltage levels at specific time points of response of CUT excited by a specialized PWL testing stimulus was presented in [31].…”

Section: Introductionmentioning

confidence: 99%

Analog Circuit Specification Testing by Means of Walsh–Hadamard Transform and Multiple Regression Supported by Evolutionary Computations

Golonek

Machniewski

2017

Circuits Syst Signal Process

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This paper describes an approach for an analog electronic circuit specification quick verification that is based on a simple mathematical model determined during the before-test stage statistical analysis. Generally, the observed performance parameters (e.g., cutoff frequency, phase shift at the assumed frequency point) are calculated from the Walsh-Hadamard transform components of circuit under test step time response. The optimal estimating formulas for relationship between the tested specifications and the selected components of the spectra are defined in the system based on a linear multiple regression procedure supported by genetic programming. The evolutionary computations significantly improve the approximation effectiveness by selecting the most representative points of the sequences domain and by defining the optimal set of linearizing functions. Finally, at the test stage, only a simple step stimulus and time-effective calculations are required to the tested performance parameters (specifications) of analog circuit identification and it predisposes the approach to quick production testing procedure realization or to embedding it in the mixed-signal systems. The automated built-in self-testing procedure using this concept may be easily implemented to low-cost microcontroller equipped with AD converter used for the testing response samples acquiring.

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“…Sensitivity analysis has previously been used as a means of selecting the optimum frequency to detect parametric component faults at the output of the circuit [21]. Here, we are evaluating RMS supply current test as a test for catastrophic faults.…”

Section: Test Stimulus Generationmentioning

confidence: 99%

Generation and Verification of Tests for Analog Circuits Subject to Process Parameter Deviations

Spinks¹,

Chalk

Bell

et al. 2004

Journal of Electronic Testing

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Abstract. The paper presents a test stimulus generation and fault simulation methodology for the detection of catastrophic faults in analog circuits. The test methodology chosen for evaluation is RMS AC supply current monitoring. Tests are generated and evaluated taking account of the potential fault masking effects of process spread on the faulty circuit responses. A new test effectiveness metric of probability of detection is defined and the application of the technique to an analog multiplier circuit is presented. The fault coverage figures are therefore more meaningful than those obtained with a fixed threshold.

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Analog circuit fault diagnosis based on sensitivity computation and functional testing

Cited by 165 publications

References 13 publications

High sensitivity test signatures for unconventional analog circuit test paradigms

High sensitivity test signatures for unconventional analog circuit test paradigms

Analog Circuit Specification Testing by Means of Walsh–Hadamard Transform and Multiple Regression Supported by Evolutionary Computations

Generation and Verification of Tests for Analog Circuits Subject to Process Parameter Deviations

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