S.J. Spinks scite author profile

Journal of Electronic Testing

et al. 2004

Abstract. The paper presents a test stimulus generation and fault simulation methodology for the detection of catastrophic faults in analog circuits. The test methodology chosen for evaluation is RMS AC supply current monitoring. Tests are generated and evaluated taking account of the potential fault masking effects of process spread on the faulty circuit responses. A new test effectiveness metric of probability of detection is defined and the application of the technique to an analog multiplier circuit is presented. The fault coverage figures are therefore more meaningful than those obtained with a fixed threshold.

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Supply current test of analogue and mixed signal circuits

IEE Proc., Circuits Devices Syst.

Silva

1996

Generation and verification of tests for analogue circuits subject to process parameter deviations

Chalk

et al.

The paper presents a test pattern generation and fault simulation methodology for the detection of catastrophic faults in analogue circuits. The test methodology chosen for evaluation is RMS AC supply current monitoring. Tests are generated and evaluated taking account of the potential fault masking effects of process spread on the faulty circuit responses. A new test effectiveness metric of probability of detection is defined and the application of the technique to an analogue multiplier circuit is presented. The fault coverage figures are therefore more meaningful than those obtained with a fuced threshold, although they appear lower.

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Fault orientated test and fault simulation of mixed signal integrated circuits

Eckersall

et al.

Evaluation and comparison of structural test methodologies for analogue and mixed signal circuits

Spinks²

ANTICS analogue fault simulation software

1997

Analogue fault simulation - the nightmare

Spinks¹,

Bell²

1995