In order to improve the detection sensitivity of thermo-optic infrared focal plane arrays (TOFPA), we analyzed the optical characteristics of TOFPA and the influence of pairs of high/low index films (H/L, amorphous silicon and silicon nitride) with their extinction coefficients measured by spectroscopic ellipsometry. The results show that increasing the pairs initially increases and subsequently decreases the thermo-optic sensitivity of TOFPA because of the optical absorption of readout light, and slightly enhances the infrared absorption of the target source (8-14 lm). Finally, the TOFPA with thermo-optic sensitivity 6.23% K -1 and average infrared absorption 65.2%, employing an optimizing film assembly air| hHLi 2 30.1H hLH i 2 16L|substrate, is fabricated by micro electromechanical system technologies.