1993
DOI: 10.1016/0039-6028(93)90678-d
|View full text |Cite
|
Sign up to set email alerts
|

An STM study of molecular-beam epitaxy growth of GaAs

Abstract: Scanning tunneling microscopy has been used to investigate molecular-beam epitaxy growth of GaAs. By quenching the sample during deposition, we have imaged the GaAs(001) surface as it appeared during growth. Large scale images of the surface have been obtained at coverages varying from 0.25 to 1500 layers.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

0
13
1

Year Published

1993
1993
2001
2001

Publication Types

Select...
6
2

Relationship

0
8

Authors

Journals

citations
Cited by 64 publications
(15 citation statements)
references
References 10 publications
(5 reference statements)
0
13
1
Order By: Relevance
“…This cooling process can be interpreted as a short-time annealing of the grown film. Sudijono et al 19 have shown that sample annealing can alter the overall morphology of a grown sample. It changes from a dynamical equilibrium surface during growth 20 to a morphology that recovers the information from the substrate-in terms of the original miscut-after annealing.…”
mentioning
confidence: 99%
“…This cooling process can be interpreted as a short-time annealing of the grown film. Sudijono et al 19 have shown that sample annealing can alter the overall morphology of a grown sample. It changes from a dynamical equilibrium surface during growth 20 to a morphology that recovers the information from the substrate-in terms of the original miscut-after annealing.…”
mentioning
confidence: 99%
“…29 This indicates an anisotropy of the surface. The GaAs͑001͒ surface in the ␤(2ϫ4) reconstruction exhibits an anisotropic morphology, 30,31 leading to long and relatively straight step edges along ͓110͔. The most likely candidate for a symmetry-breaking surface defect therefore is a bilayer step.…”
Section: Resultsmentioning
confidence: 99%
“…Therefore, the increasing average value of r RMS indicates that an increasing number of layers is involved. Sudijono et al 4 used scanning tunneling microscopy ͑STM͒ to study the evolution of surface roughness. They observed no significant increase of roughness during growth.…”
Section: Evolution Of Surface Roughnessmentioning
confidence: 99%
“…As interface smoothness is ultimately determined by that of the growing surface, it is technologically important to understand the mechanisms controlling morphology. 4 Basic atomistic processes determining the crystal growth and, thus, the morphological evolution are arrival, desorption, reaction, dissociation, surface diffusion, step edge attachment as well as detachment, and nucleation. These kinetic processes are controlled by the prevalent growth parameters, of which the most important are the growth temperature, the growth rate, and the flux ratio in the case of compound semiconductors.…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation