An operational amplifier model for evaluating test strategies at behavioural level

Romero, Eduardo; Peretti, Gabriela; Marques, Carlos Alberto

doi:10.1016/j.mejo.2007.08.006

Cited by 5 publications

(11 citation statements)

References 9 publications

Supporting

Mentioning

Contrasting

Unclassified

Order By: Relevance

“…Macromodels and behavioral models are commonly used in these days. Structural macromodels could be used for injecting faults at the behavioral level by means of deviations in the parameters of the model components [13] . However, the model used in Ref.…”

Section: High Level Fault Modeling and Simulationmentioning

confidence: 99%

“…However, the model used in Ref. [13] is a simple linear model, so it is unable to model strong nonlinear behavior.…”

Section: High Level Fault Modeling and Simulationmentioning

confidence: 99%

“…Macromodels themselves can become building blocks for other models. However, there is a significant restriction: the modeler must use the predefined element, which can limit the ability to easily incorporate required effects, and many important characteristics of real opamps may be neglected and that there is no straightforward relation between the specifications and model parameters [13] . Models at the behavioral level comprise mathematical relationships between input and output signals.…”

Section: High Level Fault Modeling and Simulationmentioning

confidence: 99%

“…However, the outputs presented in Ref. [13] do not seem match very well such as the frequency response and the simulation speed is not mentioned during fault simulation.…”

Section: Introductionmentioning

confidence: 99%

“…Furthermore, structural test may provide additional information on quality and reliability which is not available in functional test [7] . Unfortunately, the traditional test evaluations based on structural fault injection are difficult to perform as the circuit schematic is usually not available early in the developing process [13] . An early test in the process by using functional test allows putting different alternatives for test prior schematic or layout generation under consideration, and the required parameters are able to meet specifications [13] .…”

Section: Introductionmentioning

confidence: 99%

See 4 more Smart Citations

Review of high level fault modeling approaches for mixed-signal systems

Xia

Ian

Antony

2010

J. Electron.(China)

View full text Add to dashboard Cite

In the modern analogue design, Transistor Level Fault Simulation (TLFS) plays the important part since every fault in the whole circuit has to be simulated at that level. Unfortunately, it is a very CPU intensive task even though it maintains the high accuracy. Therefore, High Level Fault Modeling (HLFM) and High Level Fault Simulation (HLFS) are required in order to alleviate the efforts of simulation. In this paper, different HLFM approaches are reviewed at the device level during last two decades. We clarify their domains of application and evaluate their strengths and current limitations. We also analyze causes of faults and introduce various test approaches.

show abstract

Section: High Level Fault Modeling and Simulationmentioning

confidence: 99%

“…However, the model used in Ref. [13] is a simple linear model, so it is unable to model strong nonlinear behavior.…”

Section: High Level Fault Modeling and Simulationmentioning

confidence: 99%

Section: High Level Fault Modeling and Simulationmentioning

confidence: 99%

“…However, the outputs presented in Ref. [13] do not seem match very well such as the frequency response and the simulation speed is not mentioned during fault simulation.…”

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

See 3 more Smart Citations

Review of high level fault modeling approaches for mixed-signal systems

Xia

Ian

Antony

2010

J. Electron.(China)

View full text Add to dashboard Cite

show abstract

Survey and Evaluation of Automated Model Generation Techniques for High Level Modeling and High Level Fault Modeling

et al. 2013

View full text Add to dashboard Cite

Analog Defect Injection and Fault Simulation Techniques: A Systematic Literature Review

Azam

Dall'Ora

Fraccaroli

et al. 2024

IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

View full text Add to dashboard Cite

Since the last century, the exponential growth of the semiconductor industry has led to the creation of tiny and complex integrated circuits, e.g., sensors, actuators, and smart power. Innovative techniques are needed to ensure the correct functionality of analog devices that are ubiquitous in every smart system. The ISO 26262 standard for functional safety in the automotive context specifies that fault injection is necessary to validate all electronic devices. For decades, standardization of defect modeling and injection mainly focused on digital circuits and, in a minor part, on analog ones. An initial attempt is being made with the IEEE P2427 draft standard that started to give a structured and formal organization to the analog testing field.Various methods have been proposed in the literature to speed up the fault simulation of the defect universe for an analog circuit. A more limited number of papers seek to reduce the overall simulation time by reducing the number of defects to be simulated. This literature survey describes the state-of-the-art of analog defect injection and fault simulation methods. The survey is based on the Preferred Reporting Items for Systematic Reviews and Meta-Analyses (PRISMA) methodological flow, allowing for a systematic and complete literature survey. Each selected paper has been categorized and presented to provide an overview of all the available approaches. In addition, the limitations of the various approaches are discussed by showing possible future directions.

show abstract

An operational amplifier model for evaluating test strategies at behavioural level

Cited by 5 publications

References 9 publications

Review of high level fault modeling approaches for mixed-signal systems

Review of high level fault modeling approaches for mixed-signal systems

Survey and Evaluation of Automated Model Generation Techniques for High Level Modeling and High Level Fault Modeling

Analog Defect Injection and Fault Simulation Techniques: A Systematic Literature Review

Contact Info

Product

Resources

About