Survey and Evaluation of Automated Model Generation Techniques for High Level Modeling and High Level Fault Modeling

Analog Defect Injection and Fault Simulation Techniques: A Systematic Literature Review

“…The time-domain algorithm for fault simulation work in two iterative shells. One is the outer iteration that steps through [22] Fault modeling and simulation [23] Parametric fault simulation 2011 [24] Efficient time-domain simulation [25] Fault equivalence 2011 [26] Fault sensitivity analysis [27] Parametric variation 2011 [28] Fault sensitivity analysis [29] Behavioral level simulation 2012 [30] Fast fault simulation [31] Behavioral level simulation 2012 [32] Layout level defect injection [33] Fault sensitivity analysis 2012 [34] Inductive Fault analysis [35] High-level fault simulation 2013 [36] Numerical-based method [37] Parallel fault simulation 2013 [38] Inductive fault analysis [39] Tool for fault simulation 2013 [40] High-level fault simulation [9] Behavioral level simulation 2014 [41] Fault list compression technique [42] Multi-level hierarchical analogue fault simulation 2014 [43] Practical random sampling [44] Fast fault simulation for nonlinear analog circuits 2014 [45] Impedance calculation [46] [77] Macro modeling of analog components [78] Behavioral level fault simulation 2018 [79] Simulation at high abstraction level [80] Systematic method 2018 [81] Random sampling [82] Mixed-mode fault simulation 2019 [2] Likelihood-weighted random sampling of defects [83] Test point selection 2019 [84] Industrial Analog fault simulator [85] Analog fault injection and simulation interface 2019 ...…”

“…1) Behavioral level analog fault simulation: Fault simulation and injection can be performed at a high level, as described in [40]. Applying behavioral models is one of the methods proposed in the literature to increase fault simulation speed.…”

“…Fault simulation using high-level models [9], [53], [91], [29], [62], [89], [82], [35], [31], [58], [66], [74], [78], [40], [87], [55], [42], [82], [91], [56] Fault simulation using fault grouping [70], [21], [48], [46], [54], [92], [65], [41], [86], [8], [25], [60] Concurrent and parallel fault simulation [7], [51], [69], [61], [37], [51], [30] Fault sensitivity analysis [11], [75], [33], [49], [26], [28] Monte Carlo simulation [10], [47], [22] DC fault simulation [64]…”

Varying percentages of full uniform shading of a PV module in a controlled environment yields linear power reduction

“…The working principle of a PV cell is based on the 'photovoltaic effect' in that when sunlight falls on a cell that consists of a normal p-n junction, photons are absorbed, resulting in electron-hole pairs being generated [39]. Essentially, circuits that contain semiconductor devices are non-linear, most obviously for devices such as diodes and siliconcontrolled rectifiers where the IV characteristics change abruptly [40]. The characteristics of PV cells are therefore non-linear, depending to a large degree on environmental parameters like temperature, solar irradiation, shading, humidity and pressure [41].…”