2008
DOI: 10.1088/0960-1317/18/10/104002
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An innovating technological approach for Si–SiGe superlattice integration into thermoelectric modules

Abstract: This paper presents the development of doped polycrystalline Si-SiGe superlattices as thermoelectric (TE) elements integrated into generators. The modules dimension is 1 cm 2 , Si and SiGe are in situ doped (n and p types) and realized by CVD (chemical vapor deposition) on a 4 inch (0 0 1) silicon wafer. Si-SiGe superlattice growth will be studied, as well as the integration into thermoelectric modules. Interest in using superlattices as TE materials will be justified by their thermal conductivity measurements… Show more

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Cited by 6 publications
(5 citation statements)
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“…Moreover, the increase in the power factor is obtained here by an increase in the Seebeck coefficient and a stable electrical resistivity, which is the opposite of how it was obtained in the literature [9]. But as explained previously, our references samples have been voluntarily made with the same monocrystalline Si 0.85 Ge 0.15 thin film and about 8 W m −1 K −1 for a Si 0.5 Ge 0.5 monocrystalline bulk sample are in good agreement with the values reported in the literature [4,7].…”
Section: Thermoelectric Parameterssupporting
confidence: 90%
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“…Moreover, the increase in the power factor is obtained here by an increase in the Seebeck coefficient and a stable electrical resistivity, which is the opposite of how it was obtained in the literature [9]. But as explained previously, our references samples have been voluntarily made with the same monocrystalline Si 0.85 Ge 0.15 thin film and about 8 W m −1 K −1 for a Si 0.5 Ge 0.5 monocrystalline bulk sample are in good agreement with the values reported in the literature [4,7].…”
Section: Thermoelectric Parameterssupporting
confidence: 90%
“…This result shows the effect of nanostructuration by including silicide QDs in the reduction of the material's thermal conductivity. Reference values of 6.1 W m −1 K −1 for a monocrystalline Si 0.85 Ge 0.15 thin film and about 8 W m −1 K −1 for a Si 0.5 Ge 0.5 monocrystalline bulk sample are in good agreement with the values reported in the literature [4,7].…”
Section: Thermoelectric Parameterssupporting
confidence: 89%
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