1991
DOI: 10.1109/4.75040
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An experimental 1.5-V 64-Mb DRAM

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Cited by 167 publications
(54 citation statements)
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“…This would avoid large V DROP . However, Nakagome et al (1991) CrossLoad CP suffers from low conduction due to gate drive capabilities of PMOS load switches and no gains from series switches when V IN <V TH or when V OUT is minute due to heavy loads (Kim et al, 2015). Recently, literatures in (Favrat et al, 1998;Chen et al, 2010;Ulaganathan et al, 2012;Kim et al, 2015) provide improved versions of this Cross-Load CP (Nakagome et al, 1991) to enhance these constraints associated to LV start-up operations.…”
Section: Cross-coupled Charge Pumpmentioning
confidence: 99%
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“…This would avoid large V DROP . However, Nakagome et al (1991) CrossLoad CP suffers from low conduction due to gate drive capabilities of PMOS load switches and no gains from series switches when V IN <V TH or when V OUT is minute due to heavy loads (Kim et al, 2015). Recently, literatures in (Favrat et al, 1998;Chen et al, 2010;Ulaganathan et al, 2012;Kim et al, 2015) provide improved versions of this Cross-Load CP (Nakagome et al, 1991) to enhance these constraints associated to LV start-up operations.…”
Section: Cross-coupled Charge Pumpmentioning
confidence: 99%
“…5b. These dual-branch structures were introduced to lower ripples in the CTS design (Kleveland, 2002;New et al, 2012) and later evolved into latch-based designs (Nakagome et al, 1991;Gariboldi and Pulvirenti, 1994;1996;Favrat et al, 1998;Pelliconi et al, 2003;Ker et al, 2006;Che et al, 2009;Chen et al, 2010;Ulaganathan et al, 2012;Peng et al, 2014;Kim et al, 2015) which are currently gaining popularity. These structures have V OUT similar to Equation 1 but with reduced charge transfer intervals of T/2 (Palumbo and Pappalardo, 2010), circuit minimization with smaller C PUMP values and half the ripple, V R compared to single branch CPs where V R is expressed as V R = I OUT T/[2(C OUT +C PUMP )] (Pan and Samaddar, 2010) assuming C OUT >> C PUMP .…”
Section: Dual-branch Charge Pumpmentioning
confidence: 99%
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“…In Figure 6.14 the capacitor (now C2) is precharged through an nMOS switch M2. The capacitor can be charged to V DD since the gate of M2 is controlled by a boosted voltage generated with M1 and C1 [132]. The well bias for the pMOS transistor M3 is produced with another charge pump.…”
Section: Gate Voltage Boostingmentioning
confidence: 99%