1997
DOI: 10.1016/s0141-6359(97)00005-6
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An exact algorithm for self-calibration of two-dimensional precision metrology stages

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Cited by 77 publications
(77 citation statements)
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“…A calibration and compensation process [30,31] is necessary to improve the positioning accuracy to sub-micron level over the entire working range of the stage. A higher degree-of-freedom system is desired for measurement and control of out-of-plane motions of the stage, including pitching (θ X ), rolling (θ Y ) as well as the Z-directional position.…”
Section: Discussionmentioning
confidence: 99%
“…A calibration and compensation process [30,31] is necessary to improve the positioning accuracy to sub-micron level over the entire working range of the stage. A higher degree-of-freedom system is desired for measurement and control of out-of-plane motions of the stage, including pitching (θ X ), rolling (θ Y ) as well as the Z-directional position.…”
Section: Discussionmentioning
confidence: 99%
“…Terdapat jenis-jenis metode rehearsal lainnya yang tidak dibahas dalam bab ini, seperti metode untuk wahana pergerakan 2D (Ye et al 1997).…”
Section: Dasar-dasar Metode Rehearsal Untuk Pemisahan Error Dan Self-unclassified
“…Self-calibration approaches are typically used [70,[79][80][81][82]. For the calibration of large machine tools, a large artifact of the required geometric accuracy is needed, which is often difficult and/or expensive.…”
Section: Measurement Of Artifactsmentioning
confidence: 99%