“…The Hall factor r H is known to vary with doping, temperature, geometry (aspect ratio) and gate voltage [17]. In addition to the variation of the relative current sensitivities due to the Hall mobility as per (4), the relative current sensitivities are also directly dependent on the MAGFET geometry (the channel length in relation to the channel width), technological parameters such as source narrowing (D), and, on the gate-tosource and the gate-to-drain DC-biasing voltages [7,12]. Some authors (Rodrigo model) [18] consider it to be dependent only on Hall mobility, considering the extended Hall mobility model given by (4).…”