2008 58th Electronic Components and Technology Conference 2008
DOI: 10.1109/ectc.2008.4550125
|View full text |Cite
|
Sign up to set email alerts
|

An alternative solder interconnect reliability test to evaluate drop impact performance

Abstract: With the increased use of mobile phones, navigation

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1

Citation Types

0
3
0

Year Published

2009
2009
2023
2023

Publication Types

Select...
2
2
1

Relationship

0
5

Authors

Journals

citations
Cited by 5 publications
(3 citation statements)
references
References 8 publications
0
3
0
Order By: Relevance
“…The bump is clamped by a special gripper that induces considerable deformation on the solder sphere, and then load is applied to the pad until failure. The large deformation induced by the grippers on the solder bump makes correlation of results to PCBA level pad-crater complex [18]. The pull angle for both pin and bump pull can be varied to simulate PCBA level loading, but one author has reported no difference in pad strength with change in pull angle, and another has reported an increase in cohesive pad crater over adhesive (see Figure 14) with decrease in pull angle from normal to the plane of the PCB surface [19,20].…”
Section: Literature Reviewmentioning
confidence: 99%
“…The bump is clamped by a special gripper that induces considerable deformation on the solder sphere, and then load is applied to the pad until failure. The large deformation induced by the grippers on the solder bump makes correlation of results to PCBA level pad-crater complex [18]. The pull angle for both pin and bump pull can be varied to simulate PCBA level loading, but one author has reported no difference in pad strength with change in pull angle, and another has reported an increase in cohesive pad crater over adhesive (see Figure 14) with decrease in pull angle from normal to the plane of the PCB surface [19,20].…”
Section: Literature Reviewmentioning
confidence: 99%
“…Some prior use of the FE method to analyse an interconnect pull test can be found in the literature. Zaal et al 14,15 used FE simulations to calculate the distribution of plastic strain in a solder ball during a pull test. Yeh and Lai 16 used FE calculations with a strain-rate dependent material model to investigate the switch from a ductile failure of the interconnect to a (desired) brittle interfacial failure at the substrate at increasing pull speed.…”
Section: Fe Analysis Need For Numerical Analysismentioning
confidence: 99%
“…Drop impact testing of component boards has been widely employed to study the reliability of solder interconnections [10][11][12][13][14][15][16][17][18][19][20][21][22][23]. There are, however, some drawbacks related to the travelling table drop testers.…”
Section: Introductionmentioning
confidence: 99%