Amorphous Oxide Layers on Gold and Nickel Films Observed by Electron Microscopy

Gimpl, M. L.; McMaster, A. D.; Fuschillo, N.

doi:10.1063/1.1713272

Cited by 41 publications

(13 citation statements)

References 5 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…8,9 In addition, Chao et al 10 reported the formation of NiO on the surface and development of porosity in the Au when thin Ni/Au metallization layers were annealed in oxidizing ambients from 250 to 400°C. Gimpl et al 12 reported agglomeration in gold and nickel, and formation of holes was reported by Jaeger et al 13 in silver films prepared under ultrahigh vacuum conditions followed by exposure to air. Gimpl et al 12 reported agglomeration in gold and nickel, and formation of holes was reported by Jaeger et al 13 in silver films prepared under ultrahigh vacuum conditions followed by exposure to air.…”

Section: Discussionmentioning

confidence: 73%

Effects of a Ni cap layer on transparent Ni/Au ohmic contacts to p-GaN

Liu

Lambers

Alexander

et al. 2002

Journal of Vacuum Science &Amp; Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena

View full text Add to dashboard Cite

Ohmic contacts to p-GaN were obtained after annealing Ni/Au and Ni/Au/Ni contacts in flowing O 2 . Both Ni-capped p-GaN/Ni/Au and uncapped Ni/Au contacts were shown to result in specific contact resistance of ϳ10 Ϫ4 ⍀ cm 2 . In both cases, transparent NiO and thin, porous Au films were formed. Ni/Au contacts exhibited optical transmittance at ϭ450 nm of Ͼ85%. Addition of the Ni cap layer was shown to increase the thermal stability of thin Ni/Au ohmic contacts and increase the 450 nm transmittance to 93%, while maintaining a low contact resistance. The ability of the capping layer to produce these improvements was discussed based on a total energy model of thin film morphology.

show abstract

Section: Discussionmentioning

confidence: 73%

Effects of a Ni cap layer on transparent Ni/Au ohmic contacts to p-GaN

Liu

Lambers

Alexander

et al. 2002

Journal of Vacuum Science &Amp; Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena

View full text Add to dashboard Cite

show abstract

“…The fact that these replicas show better cont,rast compared to replicas of unannealed thin films indicates that the irregularities resulting from annealing (4 stick out more on the thin film surface than the few initial irregularities. The results of thickness measurements of these thin films are in keeping with this picture (Table 1).…”

Section: Experimcntal Resultsmentioning

confidence: 97%

“…As an indication of this may be considered the observed influence [3] of the substrate temperature T, during evaporation of thin films on the magnitude of surface irregularities. An additional support for this assumption can be deduced from the investigations on nickel thin films [4] where some important changes in the structure of those films were observed as well as crystalline growth. There is reason to belicve that such a phenomenon I.…”

Section: Introductionmentioning

confidence: 88%

The Influence of Annealing on the Structure of Polycrystalline Permalloy Thin Films

Puchalska

Sukiennicki

Petykiewicz

et al. 1967

Physica Status Solidi (b)

View full text Add to dashboard Cite

A study is made of the effect of annealing on the structure of permalloy polycrystalline thin films. Thin films of 85% Ni-15y0 Fe are investigated using an electron microscope at high temperatures. The results show that annealing causes the growth of irregularities in the thin film surface. I n extreme cases this may invalidate the concept of a uniform thin film thickness. The growth of crystallites is not isotropic but occurs most vigorously in the surface of the thin film.Der EinfluB einer Temperung auf die Struktur dunner polykristalliner Permalloyschichten (85% Ni-15y0 Fe) wird bei hohen Temperaturen elektronenmikroskopisch untersucht. Die Ergebnisse zeigen, daB die Temperung das Wachstum von IrregularitLten an der Oberflitche verursacht. I n extremen Fiillen kann dies die Vorstellung einer einheitlichen Schichtdicke hinfiillig machen. Das Wachstum von Kristalliten ist nicht isotrop, sondern findet hauptsachlich an der Oberfliiche der dunnen Schichten statt.

show abstract

“…The study of grain boundary grooves at the surface of polycrystalline thin films is of vital importance, and especially in nanomaterial sciences applied to electric and electronic processes. Many studies on thin polycrystalline films showed that when these films are submitted to a sufficient thermal treatment, several holes can be formed conducting to the degradation of materials [1][2][3][4][5][6][7][8][9]. The failure of the films resulted from the formation of grain boundary grooves [9].…”

Section: Introductionmentioning

confidence: 99%

Analytical Solutions to the Problem of the Grain Groove Profile

Hamieh¹,

Khatir²,

Ibrahim³

2018

NSTOA

View full text Add to dashboard Cite

During the last sixty years, the problem of the formation of grain boundary grooving in polycrystalline thin films, was largely studied, analyzed and commented. The thermal effect on the properties of the grain boundary grooving was first studied by Mullins in his famous paper published in 1957 and then by other authors. This paper constitutes a new contribution on the correction of Mullins problem in the case of the evaporation-condensation and proposes a more accurate solution of the partial differential equation governing the geometric profile of the grain boundary grooving. The Mullins hypothesis neglecting the first derivative (|y'|≪1) in the main equation was defeated by our new solution. In this paper, we proved that the new proposed mathematical solution giving the solution y(x, t) is valid for all x values without any approximation on the first derivative y'.

show abstract

Amorphous Oxide Layers on Gold and Nickel Films Observed by Electron Microscopy

Cited by 41 publications

References 5 publications

Effects of a Ni cap layer on transparent Ni/Au ohmic contacts to p-GaN

Effects of a Ni cap layer on transparent Ni/Au ohmic contacts to p-GaN

The Influence of Annealing on the Structure of Polycrystalline Permalloy Thin Films

Analytical Solutions to the Problem of the Grain Groove Profile

Contact Info

Product

Resources

About