“…De Chiffre et al also discussed in detail the application of XCT to individual industries, including AM, as well as challenges and barriers to the technology, noting the following as primary concerns: measurement accuracy, large and high density parts, signal-to-noise ratio, reconstruction algorithms, task-specific measurement setups, multi-material measurements, setup time, measurement uncertainty, in-line measurements and high costs. Todorov et al [93] studied NDE methods of complex AM alloy components, discussing defect formation and mitigation, and qualitatively defining design complexity into five groups. Group one, for example, contained simple parts that could be inspected using conventional methods, whereas groups four and five comprised components producible exclusively by AM and requiring new NDE inspection techniques.…”