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Abstract. In this review, the use of x-ray computed tomography (XCT) is examined, identifying the requirement for volumetric dimensional measurements in industrial verification of additively manufactured (AM) parts. The XCT technology and AM processes are summarised, and their historical use is documented. The use of XCT and AM as tools for medical reverse engineering is discussed, and the transition of XCT from a tool used solely for imaging to a vital metrological instrument is documented. The current states of the combined technologies are then examined in detail, separated into porosity measurements and general dimensional measurements. In the conclusions of this review, the limitation of resolution on improvement of porosity measurements and the lack of research regarding the measurement of surface texture are identified as the primary barriers to ongoing adoption of XCT in AM. The limitations of both AM and XCT regarding slow speeds and high costs, when compared to other manufacturing and measurement techniques, are also noted as general barriers to continued adoption of XCT and AM.

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On-machine and in-process surface metrology are important for quality control in manufacturing of precision surfaces. The classifications, requirements and tasks of on-machine and in-process surface metrology are addressed. The state-of-the-art on-machine and in-process measurement systems and sensor technologies are presented. Error separation algorithms for removing machine tool errors, which is specially required in on-machine and in-process surface metrology, are overviewed, followed by a discussion on calibration and traceability. Advanced techniques on sampling strategies, measurement systems-machine tools interface, data flow and analysis as well as feedbacks for compensation manufacturing are then demonstrated. Future challenges and developing trends are also discussed.

. (2016) Quantification and characterisation of porosity in selectively laser melted Al-Si10-Mg using x-ray computed tomography. Materials Characterization, 111 . pp. 193-204. ISSN 1873-4189 Access from the University of Nottingham repository: http://eprints.nottingham.ac.uk/31972/1/CT_paper_accepted_manuscript.pdf Copyright and reuse:The Nottingham ePrints service makes this work by researchers of the University of Nottingham available open access under the following conditions. This article is made available under the Creative Commons Attribution Non-commercial No Derivatives licence and may be reused according to the conditions of the licence. For more details see: http://creativecommons.org/licenses/by-nc-nd/2.5/ A note on versions:The version presented here may differ from the published version or from the version of record. If you wish to cite this item you are advised to consult the publisher's version. Please see the repository url above for details on accessing the published version and note that access may require a subscription.For more information, please contact eprints@nottingham.ac.uk ACCEPTED MANUSCRIPT 2 AbstractWe used X-ray computed tomography (CT), microscopy and hardness measurements to study AlSi10-Mg produced by selective laser melting (SLM). Specimens were subject to a series of heat treatments including annealing and precipitation hardening. The specimen interiors were imaged with X-ray CT, allowing the non-destructive quantification and characterisation of pores, including their spatial distribution. The specimens had porosities less than 0.1%, but included some pores with effective cross-sectional diameters up to 260 µm. The largest pores were highly anisotropic, being flat and lying in the plane normal to the build direction. Annealing cycles caused significant coarsening of the microstructure and a reduction of the hardness from (114 ± 3) HV, in the as-built state, to (45 ± 1) HV, while precipitation hardening increased this to a final hardness of (59 ± 1) HV.The pore size and shape distributions were unaffected by the heat treatments. We demonstrate the applicability of CT measurements and quantitative defect analysis for the purposes of SLM process monitoring and refinement.

Abstract:This paper examines the performance of commercial scanning white light interferometers in a range of measurement tasks. A step height artefact is used to investigate the response of the instruments at a discontinuity, while gratings with sinusoidal and rectangular profiles are used to investigate the effects of surface gradient and spatial frequency. Results are compared with measurements made with tapping mode atomic force microscopy and discrepancies are discussed with reference to error mechanisms put forward in the published literature. As expected it is found that most instruments report errors when used in regions close to a discontinuity or those with a surface gradient that is large compared to the acceptance angle of the objective lens. Amongst other findings, however, we report systematic errors that are observed when the surface gradient is considerably smaller. Although these errors are typically less than the mean wavelength they are significant compared to the instrument resolution and indicate that current scanning white light interferometers should be used with some caution if sub-wavelength accuracy is required.