1997
DOI: 10.1016/s0040-6090(96)09270-x
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Aluminum nitride and alumina composite film fabricated by DC plasma processes

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Cited by 50 publications
(25 citation statements)
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“…The N 1s peak observed at 397.3 eV corresponds to the binding energy of N 1s in the N-Al bond, 31 and the other peak at 399.5 eV is N 1s in the N-N bond. 31 The results corroborate the formation of AlN. The Al 2p signal in Fig.…”
Section: Resultssupporting
confidence: 76%
“…The N 1s peak observed at 397.3 eV corresponds to the binding energy of N 1s in the N-Al bond, 31 and the other peak at 399.5 eV is N 1s in the N-N bond. 31 The results corroborate the formation of AlN. The Al 2p signal in Fig.…”
Section: Resultssupporting
confidence: 76%
“…The optical, mechanical and gas barrier properties of the AlON films have also been investigated [1][2][3]9,11]. However, little attention has been paid to the preparation of AlON films by chemical vapor deposition (CVD).…”
Section: Introductionmentioning
confidence: 99%
“…3 showed Al2p and N1s narrow scan spectra of the N-Al co-doped ZnO (Zn:N:Al = 1:3:0.1) deposited on n-type silicon substrate. The peak around 75 eV is attributed to Al2p of N-Al bonds, considering the value reported for AlN film (74.2 eV) [17]. There are two basic possible bonds of N in ZnO: O-N and Zn-N, which can be regarded as N replacement of O and Zn, respectively [15].…”
Section: Resultsmentioning
confidence: 96%