2016 IEEE International Electron Devices Meeting (IEDM) 2016
DOI: 10.1109/iedm.2016.7838542
|View full text |Cite
|
Sign up to set email alerts
|

Ag/HfO<inf>2</inf> based threshold switch with extreme non-linearity for unipolar cross-point memory and steep-slope phase-FETs

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

1
30
0

Year Published

2017
2017
2022
2022

Publication Types

Select...
9
1

Relationship

0
10

Authors

Journals

citations
Cited by 36 publications
(31 citation statements)
references
References 4 publications
1
30
0
Order By: Relevance
“…Though the nonlinear selectors can be developed for the most studied bipolar RRAM array, there is always a tradeoff that when larger operating voltages are used to output high selectivity (ON/OFF ratio) and ON-state current, there will be a large leakage current. By comparison, cation-based TS selectors dominated by formation/spontaneous-rupture of fragile conductive filaments (CFs) have been proved to possess low voltages, high selectivity, and ultra-low leakage current [22,23]. Furthermore, 1S1R configuration comprising cation-based selectors functions well indicating the feasibility of future high-density integration of 1S1R RRAM array [24,25].…”
Section: Introductionmentioning
confidence: 99%
“…Though the nonlinear selectors can be developed for the most studied bipolar RRAM array, there is always a tradeoff that when larger operating voltages are used to output high selectivity (ON/OFF ratio) and ON-state current, there will be a large leakage current. By comparison, cation-based TS selectors dominated by formation/spontaneous-rupture of fragile conductive filaments (CFs) have been proved to possess low voltages, high selectivity, and ultra-low leakage current [22,23]. Furthermore, 1S1R configuration comprising cation-based selectors functions well indicating the feasibility of future high-density integration of 1S1R RRAM array [24,25].…”
Section: Introductionmentioning
confidence: 99%
“…Indeed, a much smaller voltage also would pass through the device with the subsequent read voltage pulse. This is because it also causes a sneak current, as shown in Figure 2(a), although it is two order of magnitude smaller than ON current [6], [25]. The operation speed is faster than the Ag doped HfO 2 selector without GO (75 ns/ 250 ns for ON/OFF operations [7]).…”
Section: Resultsmentioning
confidence: 98%
“…The threshold selectors (i.e., TS devices) can be turned on at ~ 0.25 V and show ~ 6 orders of abrupt threshold switching at 10 μA compliance current. In 2016, Shukla et al have also showed the phase FET with HfO 2 -based TS device, for the first time [ 91 ]. The HfO 2 -based TS device can be worked as the threshold selector at 100 μA compliance current.…”
Section: Negative Differential Resistance Fet (Phase Fet)mentioning
confidence: 99%