2007
DOI: 10.1017/s1431927607070869
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Advances in Pulsed-Laser Atom Probe: Instrument and Specimen Design for Optimum Performance

Abstract: The performance of the pulsed-laser atom probe can be limited by both instrument and specimen factors. The experiments described in this article were designed to identify these factors so as to provide direction for further instrument and specimen development. Good agreement between voltage-pulsed and laser-pulsed data is found when the effective pulse fraction is less than 0.2 for pulsed-laser mode. Under the conditions reported in this article, the thermal tails of the peaks in the mass spectra did not show … Show more

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Cited by 162 publications
(137 citation statements)
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“…Meanwhile, the successful analysis of oxides and ceramics by atom probe tomography has been reported multiple times, see e.g. [22][23][24][25][26].…”
Section: Atom Probe Tomographymentioning
confidence: 99%
“…Meanwhile, the successful analysis of oxides and ceramics by atom probe tomography has been reported multiple times, see e.g. [22][23][24][25][26].…”
Section: Atom Probe Tomographymentioning
confidence: 99%
“…In particular the implementation of laser pulsing capabilities [3][4][5][6][7][8], has made possible routine analysis of semiconducting materials. APT relies on the time-controlled removal of surface atoms in the form of ions, from a needle-shaped specimen, induced by a very intense electric field in a process known as field evaporation [9][10].…”
Section: Introductionmentioning
confidence: 99%
“…This may be resulted from the difference of cooling duration. The cooling duration was depended on the tip temperature, spot size, curvature radius and taper angle [17]. The curvature radius and taper angle was almost constant in all specimens from the observation of TEM before the analysis by 3DAP.…”
Section: Resultsmentioning
confidence: 93%