Advanced simulations of optical transition and diffraction radiation

Aumeyr, T.; Billing, M.; Bobb, Lorraine; Bolzon, B.; Bravin, E.; Karataev, P.; Kruchinin, Konstantin; Lefèvre, T.; Mazzoni, Stefano

doi:10.1103/physrevstab.18.042801

Cited by 7 publications

(4 citation statements)

References 20 publications

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“…Therefore, an initially small angular acceptance will degrade the resolution of the method. The resolution limitations investigated using the ZEMAX software were well described by us in [17,18]. It has been shown that the OTR PSF, as well as the method resolution, depend on spherical and chromatic aberrations.…”

Section: Jinst 15 P01020mentioning

confidence: 88%

“…Due to a large magnification factor the image width in the detector plane is very sensitive to the longitudinal lens position. In [17][18][19] the authors used ZEMAX simulation software and analytical theory to demonstrate that the resolution for the beam size measurements directly depends on the OTR PSF width. An offset of a 100 µm can lead to significant resolution degradation.…”

Section: Optimisation Of the Otr Monitor And Evaluation Of Uncertaintiesmentioning

confidence: 99%

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Sub-micron scale transverse electron beam size diagnostics methodology based on the analysis of optical transition radiation source distribution

et al. 2020

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A: Optical Transition Radiation (OTR) appearing when a charged particle crosses a boundary between two media with different dielectric properties has widely been used as a tool for transverse profile measurements of charged particle beams in numerous facilities worldwide. The resolution of the conventional monitors is defined by the dimensions of the Point Spread Function (PSF) distribution, i.e. the source distribution generated by a single electron and projected by an optical system onto a detector. The PSF form significantly depends on various parameters of the optical system like diffraction of the OTR tails, spherical and chromatic aberrations. The beam image is a convolution of the PSF with a transverse electron distribution in a beam. In our experiment we designed and built a system that can measure the transverse electron beam size through the analysis of the PSF distribution shape. In this paper we present the hardware, data analysis, calibration technique, a discussion on the main source of uncertainties and initial measurements of a micron-scale electron beam size with sub-micrometre resolution. K: Beam-line instrumentation (beam position and profile monitors; beam-intensity monitors; bunch length monitors); Instrumentation for particle accelerators and storage rings -high energy (linear accelerators, synchrotrons) 1Corresponding author.

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Section: Jinst 15 P01020mentioning

confidence: 88%

Section: Optimisation Of the Otr Monitor And Evaluation Of Uncertaintiesmentioning

confidence: 99%

Sub-micron scale transverse electron beam size diagnostics methodology based on the analysis of optical transition radiation source distribution

et al. 2020

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“…At a distance δ ≫ 1, the electron field will be completely restored to its original value and is completely separated with the FTR field. The validity of a purely optical model for shadowing is further confirmed by optical simulations, performed with Zemax OpticStudio [25,26], of the propagation of the forward OTR field from the first screen to the second one using near-field diffraction formulas. The resulting field is overlapped with the backward OTR field generated by the beam at the input face of the second screen.…”

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confidence: 86%

Experimental Observation of “Shadowing” in Optical Transition Radiation

et al. 2018

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We report the observation of shadowing between two optical transition radiation (OTR) sources from a 205 MeV electron beam. The total optical intensity is measured as a function of the distance d between the sources, covering the range 0 < d < 4L v , where L v is the formation length of the particles. Data show that the total optical intensity starts decreasing due to shadowing when d approaches L v until it becomes undetectable for very short distances d/L v → 0. A model based solely on interference between the two OTR sources is in good agreement with experimental data. To the knowledge of the authors this is the first systematic experimental observation of shadowing in OTR.

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“…Such a target consists of a series of rectangular micrometer-scale apertures on an optical-grade substrate that, when used after a mask, allow one to reduce significantly the SR background. Optical simulations derived from previous OTR studies by our group [23,24] are performed to confirm analytical beamsize predictions with ODR data [18]. OTR measurements can be easily performed with the same instrument to crosscalibrate ODR data and provide complementary measurements for low-intensity beams.…”

Section: Introductionmentioning

confidence: 97%

Noninvasive Micrometer-Scale Particle-Beam Size Measurement Using Optical Diffraction Radiation in the Ultraviolet Wavelength Range

et al. 2020

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We present recent achievements in the application of optical diffraction radiation (ODR) to the measurement of the transverse beam size of a 1.3 GeV micrometer-size electron beam performed with an instrument installed in the extended extraction line of the KEK Accelerator Test Facility. ODR is a recent technique for the measurement of the transverse size and emittance of highly relativistic particle beams. ODR has the advantage of being a noninvasive and relatively inexpensive technique and is a candidate for the operation of linear particle accelerators, where no simple alternatives (e.g., synchrotron radiation) are available. In an effort to improve the resolution and performance, we establish an alternative target microfabrication technology, adopt solutions to improve the signal-to-noise ratio, and perform an experiment in the UV spectrum at 250 nm. With such a configuration, a transverse beam size as low as 3 μm is measured, drastically improving on past measurements reported in the literature. In light of these results, ODR, when combined with a high-resolution optical-transition-radiation monitor, represents a credible diagnostics solution for low-emittance high-intensity particle beams.

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Advanced simulations of optical transition and diffraction radiation

Cited by 7 publications

References 20 publications

Sub-micron scale transverse electron beam size diagnostics methodology based on the analysis of optical transition radiation source distribution

Sub-micron scale transverse electron beam size diagnostics methodology based on the analysis of optical transition radiation source distribution

Experimental Observation of “Shadowing” in Optical Transition Radiation

Noninvasive Micrometer-Scale Particle-Beam Size Measurement Using Optical Diffraction Radiation in the Ultraviolet Wavelength Range

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