2011
DOI: 10.1007/978-0-387-47318-5_3
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Additive Processes for Metals

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Cited by 4 publications
(2 citation statements)
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“…The TCR is, for both typologies of samples, lower than that usually reported for bulk Au and Ag [30]. Such a reduction of TCR is commonly observed for both evaporated [31] and printed [32] metallic thin films and may be attributed to rapid cooling effects, impurities present inside the film and the polycrystalline nature of such thin films [33], [34].…”
Section: A Temperature Sensingmentioning
confidence: 58%
“…The TCR is, for both typologies of samples, lower than that usually reported for bulk Au and Ag [30]. Such a reduction of TCR is commonly observed for both evaporated [31] and printed [32] metallic thin films and may be attributed to rapid cooling effects, impurities present inside the film and the polycrystalline nature of such thin films [33], [34].…”
Section: A Temperature Sensingmentioning
confidence: 58%
“…If ∼45 MPa of in-plane tensile stress is included in the calculation, the measured stiffness values align quite well. Such residual stresses are common in electroplated copper [12], but a detriment to the overall MEMI performance. As a result, the theoretical (stress-free) flat-band inductance is much higher than the experimentally measured flat-band inductance.…”
Section: Lumped Model Parameter Extractionmentioning
confidence: 99%