2015
DOI: 10.5755/j01.eee.21.3.5774
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Acceleration of Fault Simulation based on a Separate List of Faults for each Test Pattern

Abstract: A new fault simulation procedure is suggested. The procedure provides fault detection of individual test patterns at the beginning. In this way, most faults are detected quickly. The remaining faults are analysed by conventional means with a sequence of test patterns. Creation of individual fault lists of test patterns allows speeding up the fault simulation. The fault simulation acceleration increases with circuit size and test coverage.

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“…Generally, the checkability of a digital circuit is defined as its suitability for performing logical checking, which is considered as the possibility of detecting a fault, using for this the error of the result calculated at the output of this circuit in testing or operating mode [7,8].…”
Section: Related Work Goal and Structure Of The Papermentioning
confidence: 99%
“…Generally, the checkability of a digital circuit is defined as its suitability for performing logical checking, which is considered as the possibility of detecting a fault, using for this the error of the result calculated at the output of this circuit in testing or operating mode [7,8].…”
Section: Related Work Goal and Structure Of The Papermentioning
confidence: 99%