2008
DOI: 10.1134/s1063780x08090109
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Accelerated electrons and hard X-ray emission from X-pinches

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Cited by 37 publications
(27 citation statements)
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“…On the other hand the hard x-ray images (Eγ>11 keV) made with an Al filter 400µm thick have very different quality. In the case of the standard X pinch, the contrast and spatial resolution of the images are very low as was typically observed with standard X pinches in the past [4,5]. In the HXP image, the mesh is clearly seen and spatial resolution is much better.…”
Section: Experimental Setup and Resultsmentioning
confidence: 82%
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“…On the other hand the hard x-ray images (Eγ>11 keV) made with an Al filter 400µm thick have very different quality. In the case of the standard X pinch, the contrast and spatial resolution of the images are very low as was typically observed with standard X pinches in the past [4,5]. In the HXP image, the mesh is clearly seen and spatial resolution is much better.…”
Section: Experimental Setup and Resultsmentioning
confidence: 82%
“…Higher energy X-ray radiation in the 8-100 keV range is also emitted [4,5]. In a standard X-pinch, beginning immediately after the soft X-ray burst, this higher energy ("hard") X-ray radiation is emitted which is attributed to energetic electrons accelerated in the gap that develops in the plasma at the X-pinch cross point immediately after the X-ray burst.…”
Section: Introductionmentioning
confidence: 99%
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“…In the MHXP with the Bz configuration, the bright radiating spot was more likely to be observed on the cathode side of the diode gap, but the resulting plasma conditions did not reach parameters required to be considered a "hot spot" (small size, short lifetime, intense continuum) as defined in references [4,5]. Most of the radiation was caused by accelerated electrons in minidiode [6,7]. Better results were obtained in the MHXP with the "cusp" configuration both on the XP (Fig.…”
mentioning
confidence: 99%
“…5 that is consistent with a time-integrated 6-9 keV source size of 5 µm diameter. The slit measurements were very difficult to obtain due to background from high-energy diffuse sources (e.g., post-pinch electron beams [27,28]), so only some tests succeeded in this direct measurement.…”
mentioning
confidence: 99%