AC-DC factor sensitivity for DRAM components lifetime under hot-carrier injection

Reliability considerations of ULP scaled CMOS in spacecraft systems

“…S. Baeg, et al, showed a particular sensitivity to the AC-to-DC factor (ADF) of the DRAM. ADF sensitivity was reviewed under three parameters: device degradation, effective drain voltage in the word-line driving circuit, and access frequency [6]. It was found that ADF values decreased with increasing degradation, and that the AC lifetime was reduced with decreased ADF.…”

“…The timing margin in the word-line signal was more related to the change in ADF than the change in degradation. These failure issues were observed in numerous products with back-to-back accesses to one word-line circuit by system software [6].…”