2009
DOI: 10.1108/02602280910967675
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A wet‐etch method with improved yield for realizing polysilicon resistors in batch fabrication of MEMS pressure sensor

Abstract: Purpose-The purpose of this paper is to present a selective wet-etching method of boron doped low-pressure chemical vapour deposition (LPCVD) polysilicon film for the realization of piezoresistors over the bulk micromachined diaphragm of (100) silicon with improved yield and uniformity. Design/methodology/approach-The method introduces discretization of the LPCVD polysilicon film using prior etching for the grid thus dividing each chip on the entire wafer. The selective etching of polysilicon for realizing of … Show more

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Cited by 12 publications
(2 citation statements)
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“…The four piezoresistors are connected in the form of Wheatstone bridge to output electric signal caused by pressure in Fig. 4 [7]. The power supply is constant current.…”
Section: Design Of the Circular Diaphragm Chipmentioning
confidence: 99%
“…The four piezoresistors are connected in the form of Wheatstone bridge to output electric signal caused by pressure in Fig. 4 [7]. The power supply is constant current.…”
Section: Design Of the Circular Diaphragm Chipmentioning
confidence: 99%
“…This technique utilizes advantages of surface as well as bulk micromachining in order to form a cavity under the defined membrane type diaphragm. The present work also utilizes the wet etching of polysilicon layer (Singh et al , 2009) for the realization of resistors. The double cavity vacuum‐sealed sensor having two diaphragms has an advantage of being used as a pressure sensor as well as a flow sensor.…”
Section: Introductionmentioning
confidence: 99%