A Synchronous Measurement System for the First Derivative of Out-of-Plane Deformation of Double Ends

Wu, Shuangle; Yao, Yanfeng; Wang, Biao; Wang, Yonghong; Yang, Fenglong

doi:10.1109/tim.2022.3172435

Cited by 6 publications

(1 citation statement)

References 21 publications

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“…(5). The interference phase change fringe map caused by the object deformation was obtained by subtracting the two values 19 . High-quality measurement results were determined using temporal phase shift technology to extract the interference phase.…”

Section: Measurement Principlementioning

confidence: 99%

Synchronous measurement of surface deformation and gradient distribution in microstructures

Wang

Yin

et al. 2022

Opt. Eng.

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In the traditional microfield speckle pattern interference measurement system, due to the use of high-magnification objective lens, the working distance is small and the shearing device cannot be introduced to implement shearography measurement. Thus the distribution of the deformation gradient on a microstructure surface cannot be measured. A system for the synchronous measurement of the surface deformation and gradient distribution of a microstructure was designed. Through the combination of focusing lens, convex lens, and low-magnification objective lens, the microstructure surface was clearly magnified and the internal distance of the system was enlarged. Thus the shearing device can be introduced to realize the shearography measurement under the microfield view. The synchronous full-field measurement of the structural surface deformation and its gradient distribution was further realized by the introduction of a reference light and designing of an optical path switch. In addition, the designed system had a zoom feature, which can facilitate the measurement in variable field of view in a certain range. The feasibility of the system was verified by theoretical analysis and experiment, and the practicability was validated by testing the chip and circuit board.

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Section: Measurement Principlementioning

confidence: 99%

Synchronous measurement of surface deformation and gradient distribution in microstructures

Wang

Yin

et al. 2022

Opt. Eng.

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Photothermal vortex interferometer with azimuthal complex spectra analysis for the measurement of laser-induced nanoscale thermal lens dynamics

Dong,

Zhang,

Yang

et al. 2023

Review of Scientific Instruments

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A photothermal vortex interferometer (PTVI) is proposed to fill the gap of full-field measurement of the laser-induced nanoscale thermal lens dynamics of optical elements. The PTVI produces a multi-ring petal-like interferogram by the coaxial coherent superposition of the high-order conjugated Laguerre–Gaussian beams. The non-uniform optical path change (OPC) profile resulting from the thermal lens causes the petals of the interferogram at the different radii to shift by the different azimuths. To demodulate such an interferogram, an azimuthal complex spectra analysis is presented by using a camera with a pixelated multi-ring pattern written on its sensor to extract multiple azimuthal intensity profiles synchronously from the interferogram. Therefore, the OPC profile can be determined dynamically from the complex spectra of the azimuthal intensity profiles at the main frequency components. An analytical thermophysical model of the thermal lens is given, and the basic principle of the azimuthal complex spectra analysis is revealed. A proof-of-concept experiment is demonstrated using a N-BK7 glass sample heated by a pump laser. The results verified that the PTVI achieves the measurement accuracy of 47 pm with a standard deviation of 358 pm (3σ) and can be used for full-field measurement of the nanoscale OPC profile caused by the thermal lens dynamics. Due to the picometer-scale accuracy of the PTVI, the absorption coefficient and thermal diffusivity of the glass sample were determined to be A0 = 0.126 m−1 and D = 5.63 × 10−7 m2 s−1, respectively, which agree with the nominal ones of A0 = 0.129 m−1 and D = 5.17 × 10−7 m2 s−1. Although the PTVI is only suitable for measuring the rotationally symmetric OPC, it shows less computation burden and hardware complexity, and it is proved to be a highly sensitive and effective tool in studying optical, thermo-physical, and mechanical properties of optical elements.

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A Simultaneous Multi-Directional Defects Measurement Based on Polarization-Multiplexed Four-Directional Digital Shearography With Large Field of View

Yan

Tan

Huang

et al. 2023

IEEE Trans. Instrum. Meas.

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A Synchronous Measurement System for the First Derivative of Out-of-Plane Deformation of Double Ends

Cited by 6 publications

References 21 publications

Synchronous measurement of surface deformation and gradient distribution in microstructures

Synchronous measurement of surface deformation and gradient distribution in microstructures

Photothermal vortex interferometer with azimuthal complex spectra analysis for the measurement of laser-induced nanoscale thermal lens dynamics

A Simultaneous Multi-Directional Defects Measurement Based on Polarization-Multiplexed Four-Directional Digital Shearography With Large Field of View

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