1998
DOI: 10.1016/s0040-6090(97)00917-6
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A study of the depth dependence of photoluminescence from thin film CdS/CdTe solar cells using bevel etched samples

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Cited by 37 publications
(19 citation statements)
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“…QCM electrodes used in our study are made of AT-cut piezoelectric quartz crystal with oscillation frequencies between 7.995 and 7.950 MHz. The density (F) of the crystal is 2.684 g/cm 3 , and the shear modulus (μ) of quartz is 2.947 Â 10 11 g/cm s 2 . A change of 1 Hz in QCM resonance frequency corresponds to 1.34 ng of materials adsorbed onto the crystal surface of an area of 0.196 cm 2 .…”
Section: Methodsmentioning
confidence: 99%
“…QCM electrodes used in our study are made of AT-cut piezoelectric quartz crystal with oscillation frequencies between 7.995 and 7.950 MHz. The density (F) of the crystal is 2.684 g/cm 3 , and the shear modulus (μ) of quartz is 2.947 Â 10 11 g/cm s 2 . A change of 1 Hz in QCM resonance frequency corresponds to 1.34 ng of materials adsorbed onto the crystal surface of an area of 0.196 cm 2 .…”
Section: Methodsmentioning
confidence: 99%
“…6,[14][15][16] Several papers have reported on PL studies performed on CdTe/CdS layer stacks. [17][18][19][20][21] The evolution of PL peaks during device processing was correlated with the photovoltaic performance of devices. 19,20 In general, PL peaks originating from CdTe are observed in the range of 1.3-1.5 eV.…”
Section: As Well As By Indiffusion Of Te Originating Frommentioning
confidence: 99%
“…A number of means have been utilised to investigate the diffusion of sulphur from the CdS to the CdTe absorber in solar cells; these include secondary ion mass spectrometry (SIMS) [25,26], photoluminescence spectroscopy (PL) [27][28][29] and transmission electron microscopy (TEM) combined with energy dispersive spectrometry (EDS) [16,30]. Of these methods, SIMS has the highest sensitivity and can detect impurities at a parts per million (ppm) level but suffers from limited depth resolution when investigating the deep CdTe/CdS interface, normally 3-6 μm below the back surface of the sample.…”
Section: Introductionmentioning
confidence: 99%
“…The exchange of tellurium with sulphur in CdTe has been shown to reduce the band gap of the resulting alloy [31,32] and this effect can be observed both with PL and cathodoluminescence (CL). The principal limitation of PL is the spatial resolution; the size of the laser spot and its penetration depth into the sample both being on the micrometre-scale [27].…”
Section: Introductionmentioning
confidence: 99%