The possibility of controlling the insulator-to-metal transition (IMT) in nano-particle VO2 (NP-VO2) using the electric field effect in a metal-oxide-VO2 field-effect transistor (MOVFET) at room temperature was investigated for the first time. The IMT induced by current in NP-VO2 is a function of nano-particle size and was studied first using the conducting atomic force microscope (cAFM) current-voltage (I-V) measurements. NP-VO2 switching threshold voltage (VT), leakage current (Ileakage), and the sub-threshold slope of their conductivity (Sc) were all determined. The cAFM data had a large scatter. However, VT increased as a function of particle height (h) approximately as VT(V) = 0.034 h, while Ileakage decreased as a function of h approximately as Ileakage (A) = 3.4 × 10−8e−h/9.1. Thus, an asymptotic leakage current of 34 nA at zero particle size and a tunneling (carrier) decay constant of ~9.1 nm were determined. Sc increased as a function of h approximately as Sc (mV/decade) = 2.1 × 10−3eh/6 and was around 0.6 mV/decade at h~34 nm. MOVFETs composed of Pt drain, source and gate electrodes, HfO2 gate oxide, and NP-VO2 channels were then fabricated and showed gate voltage dependent drain-source switching voltage and current (IDS). The subthreshold slope (St) of drain-source current (IDS) varied from 42 mV/decade at VG = −5 V to 54 mV/decade at VG = +5 V.