2019
DOI: 10.1063/1.5084653
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A soft x-ray reflectivity beamline for 100-1500 eV energy range at Indus-2 synchrotron radiation source

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Cited by 17 publications
(5 citation statements)
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“…The samples for XTEM measurements were prepared using a focussed ion beam (Crossbeam 340 of ZEISS) system for lamella cutting and polishing. Finally, the soft x-ray reflectivity of the samples at water-window wavelength of 3.11 nm has been recorded at the BL-03 soft x-ray beamline at Indus-2 synchrotron source, RRCAT, Indore, India [30].…”
Section: Methodsmentioning
confidence: 99%
“…The samples for XTEM measurements were prepared using a focussed ion beam (Crossbeam 340 of ZEISS) system for lamella cutting and polishing. Finally, the soft x-ray reflectivity of the samples at water-window wavelength of 3.11 nm has been recorded at the BL-03 soft x-ray beamline at Indus-2 synchrotron source, RRCAT, Indore, India [30].…”
Section: Methodsmentioning
confidence: 99%
“…The XANES data were measured in the fluorescence mode with an energy resolution of around 300 meV using a vacuum compatible silicon drift detector (make: KETEK Germany). The beamline uses a varied line spacing plane grating monochromator [15,16]. For XANES measurement, a pelletized sample was used and calibration was performed using K-edge of Mg in MgO (100) substrate.…”
Section: Experimental and Computational Methodsmentioning
confidence: 99%
“…The lower lattice mismatch value gives better in-plane orientation for the β-Ga 2 O 3 layer deposited on the GaN template compared to that deposited on the c-Al 2 O 3 substrate. The modifications in the CB of the β-(Ga 1−x Fe x ) 2 O 3 were evaluated by carrying out XAS measurements at the O K-edge and Ga L-edge, which were performed with a soft x-ray absorption spectroscopy (SXAS) beamline, BL-1, and soft x-ray reflectivity beamline, BL-3, respectively, of an Indus-2 synchrotron source [25]. The XAS data were taken in total electron yield mode at room temperature.…”
Section: Methodsmentioning
confidence: 99%