Impact of B4C buffer layer on interface diffusion in Cr/Sc multilayers: combined study by x-ray reflectivity, scattering and fluorescence
P Sarkar,
A Biswas,
Sanjay Rai
et al.
Abstract:In thin film multilayer based optical components of X-ray imaging system, diffusion of one material into the other degrades the reflectivity of the mirrors severely. Along with this thermodynamically driven diffusion, there are also growth generated interface roughness of different special frequencies and microstructures which can increase the diffused scattering from the multilayer and reduce the resolution of an image. Generally grazing incidence X-ray reflectivity in specular geometry (specular GIXR) and di… Show more
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