The application of Kossel x‐ray diffraction to the SEM is reviewed with discussion of identification of structures, determination of orientation relationships between crystals, residual strain measurements, examination of fracture surfaces and semi‐quantitative measurement of plastic strain. Geometrical theory of formation of the patterns is outlined and methods of analysis reviewed with emphasis on the techniques available when the pattern centre and specimen to film distance can be accurately determined. A recent method of obtaining the latter parameters is discussed. Pattern recognition techniques are discussed with references to F. C. Frank's model based on the intersection of an x‐ray sphere of radius 1/2 with the Brillouin zone boundaries of the crystal and estimates are produced of the diffracting volume as a function of perfection of the crystal.