A simple and precise total reflection X-ray fluorescence spectrometer: construction and its applications

Tiwari, M. K.; Sawhney, Kawal; Sankar, Balaji; Raghuvanshi, V. K.; Nandedkar, R. V.

doi:10.1016/j.sab.2004.03.010

Cited by 20 publications

(8 citation statements)

References 25 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…29,30 A 4.0 kW standalone PHILIPS X-ray generator having Cu, Mo and W targets was used as an excitation source. The fluorescence measurements were done using a Peltier cooled solid state detector (FWHM ~240 eV at 5.9 keV), a spectroscopy amplifier AMP-6300 and an 8 K multichannel pulse height analyzer installed in a personal computer.…”

Section: Methodsmentioning

confidence: 99%

Effect of Energy Dependence of Primary Beam Divergence on the X-ray Standing Wave Characterization of Layered Materials

et al. 2005

View full text Add to dashboard Cite

Incident primary beam divergence is a source of systematic error in X-ray standing wave (XSW) characterization of single and multilayer thin films. Primary beam divergence significantly alters the XSW profile of a layered material and can lead to large errors when used with higher excitation energies. The present study suggests that when one uses Mo-Kα excitation, the primary beam divergence should be in range of 0.005 0 . On the other hand, in the case of Cu-Kα excitation, primary beam divergence can be relaxed up to 0.01 0 .

show abstract

Section: Methodsmentioning

confidence: 99%

Effect of Energy Dependence of Primary Beam Divergence on the X-ray Standing Wave Characterization of Layered Materials

et al. 2005

View full text Add to dashboard Cite

show abstract

“…First of all, there are many research results on basic components of TXRF. In [ 8 , 9 ], the construction of a simple and precise TXRF spectrometer is discussed. In particular, use of parallel primary beam and polycapillary semi-lens is studied in [ 10 , 11 ], respectively.…”

Section: Related Workmentioning

confidence: 99%

Intelligent Simultaneous Quantitative Online Analysis of Environmental Trace Heavy Metals with Total-Reflection X-Ray Fluorescence

Wang

Yang

et al. 2015

Sensors

View full text Add to dashboard Cite

Total-reflection X-ray fluorescence (TXRF) has achieved remarkable success with the advantages of simultaneous multi-element analysis capability, decreased background noise, no matrix effects, wide dynamic range, ease of operation, and potential of trace analysis. Simultaneous quantitative online analysis of trace heavy metals is urgently required by dynamic environmental monitoring and management, and TXRF has potential in this application domain. However, it calls for an online analysis scheme based on TXRF as well as a robust and rapid quantification method, which have not been well explored yet. Besides, spectral overlapping and background effects may lead to loss of accuracy or even faulty results during practical quantitative TXRF analysis. This paper proposes an intelligent, multi-element quantification method according to the established online TXRF analysis platform. In the intelligent quantification method, collected characteristic curves of all existing elements and a pre-estimated background curve in the whole spectrum scope are used to approximate the measured spectrum. A novel hybrid algorithm, PSO-RBFN-SA, is designed to solve the curve-fitting problem, with offline global optimization and fast online computing. Experimental results verify that simultaneous quantification of trace heavy metals, including Cr, Mn, Fe, Co, Ni, Cu and Zn, is realized on the online TXRF analysis platform, and both high measurement precision and computational efficiency are obtained.

show abstract

“…For TXRF measurements a self-assembled TXRF spectrometer at Raja Ramanna Centre of Advanced Technology (RRCAT) Indore, India was used [1,2]. A monochromatized Mo K α source obtained from the Mo target tube operated at 30 kV and 20 mA using a W-C multilayer was used.…”

Section: Instrumentationmentioning

confidence: 99%

“…Trace amounts of uranium have been reported in sea water, phosphoric acid, phosphate fertilizers etc. [1][2][3]. The recovery of uranium from phosphate fertilizers is important from the point of view of its recovery as well as environmental concerns.…”

Section: Introductionmentioning

confidence: 99%

Trace determination of uranium in fertilizer samples by total reflection X-ray fluorescence

et al. 2011

View full text Add to dashboard Cite

Uranium is reported to be present in phosphate fertilizers. The recovery of uranium from the fertilizers is important because it can be used as fuel in nuclear reactors and also because of environmental concerns. For both these activities suitable method of uranium determinations at trace levels in these fertilizers are required. Studies have been initiated for such TXRF determination of uranium and the results are reported in the present paper. For TXRF determinations the fertilizer samples were processed with nitric acid and the uranium present in it was removed by solvent extraction using tri-n-butyl phosphate as the extractant. The organic phase containing uranium was equilibrated with 1.5% suprapure nitric acid to bring out uranium in aqueous phase. This aqueous phase was mixed with internal standard Y and the TXRF spectra were measured by depositing samples on float glass supports. The amounts of uranium in four fertilizer samples of Hungarian origin were determined by processing these TXRF spectra. Uranium concentrations in two fertilizer samples were found to be in the range of 4-6 μg/g, whereas two fertilizer samples did not show the presence of uranium. The precision of the TXRF determination of uranium was found to be better than 8% (1σ ).

show abstract

A simple and precise total reflection X-ray fluorescence spectrometer: construction and its applications

Cited by 20 publications

References 25 publications

Effect of Energy Dependence of Primary Beam Divergence on the X-ray Standing Wave Characterization of Layered Materials

Effect of Energy Dependence of Primary Beam Divergence on the X-ray Standing Wave Characterization of Layered Materials

Intelligent Simultaneous Quantitative Online Analysis of Environmental Trace Heavy Metals with Total-Reflection X-Ray Fluorescence

Trace determination of uranium in fertilizer samples by total reflection X-ray fluorescence

Contact Info

Product

Resources

About