A New Forgery Image Dataset and its Subjective Evaluation

Hossain, Faria; Dagiuklas, Tasos; Skodras, Athanassios

doi:10.1109/globconet56651.2023.10150020

Cited by 3 publications

(1 citation statement)

References 16 publications

(18 reference statements)

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“…In the subsequent sections, we explore the broader implications of these aginginduced changes, discussing potential security vulnerabilities, strategies for enhancing SRAM PUF resilience, and future directions in addressing the evolving landscape of semiconductor device aging. [27][28][29][30][31][32] Table 3 Techniques and Applications in Aging Analysis of SRAM PUFs…”

Section: Changes In Puf Responses Over Timementioning

confidence: 99%

Analyzing Aging Effects on SRAM PUFs: Implications for Security and Reliability

Bhatta,

Singh,

Amsaad

2023

Preprint

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Impact of aging effects on Static Random-Access Memory Physical Unclonable Functions (SRAM PUFs) presents critical implications for security and reliability in modern hardware. Emerging as promising hardware-based security primitives, SRAM PUFs harness process variations in integrated circuits for secure key generation and device authentication. However, aging phenomena like Bias Temperature Instability (BTI) and Hot Carrier Injection (HCI) can potentially alter SRAM cell characteristics, compromising PUF responses. This study delves into the multifaceted challenges of aging-induced variations, exposing underlying security vulnerabilities and offering innovative strategies to mitigate risks. Examining reliability implications, it introduces mitigation techniques such as adaptive reconfiguration, error correction codes, and multi-modal PUFs to enhance the resilience of SRAM PUFs. The investigation concludes by mapping future research directions and prospects for improving SRAM PUF-based security solutions, in light of the complexities associated with semiconductor device aging.

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Section: Changes In Puf Responses Over Timementioning

confidence: 99%

Analyzing Aging Effects on SRAM PUFs: Implications for Security and Reliability

Bhatta,

Singh,

Amsaad

2023

Preprint

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Analyzing Aging Effects on SRAM PUFs: Implications for Security and Reliability

Bhatta,

Singh,

Ghimire

et al. 2024

J Hardw Syst Secur

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The aging effects on Static Random-Access Memory Physical Unclonable Functions (SRAM PUFs) pose significant security and reliability challenges for current hardware systems. SRAM PUFs utilize process variations in integrated circuits for secure key generation and device authentication. However, aging effects such as bias temperature instability (BTI) and hot carrier injection (HCI) may change SRAM cell characteristics and affect PUF responses. This study addresses various aging-induced variation challenges, identifies security vulnerabilities, and provides innovative approaches to risk reduction. Furthermore, this study focuses on concerns about SRAM PUF reliability. In this regard, mitigation approaches like adaptive reconfiguration, error correction codes, and multi-modal PUFs are introduced to enhance the resilience of SRAM PUFs. This study concludes by outlining future research directions and prospects for improving SRAM PUF-based security solutions by several orders of magnitude. This is carried out with various complexities related to semiconductor device aging.

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