2023 IEEE Physical Assurance and Inspection of Electronics (PAINE) 2023
DOI: 10.1109/paine58317.2023.10318013
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Aging of SRAM PUFs: Mitigation and Advancements Through Machine Learning Techniques

Niraj Prasad Bhatta,
Harshdeep Singh,
Ashutosh Ghimire
et al.
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