2018
DOI: 10.1063/1.5031006
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A new fit to secondary emission yield in the low impact voltage regime: An improvement of Vaughan’s expression

Abstract: An alternative explanation for the density depletions observed by Freja and Viking satellites AIP Advances 8, 085010 (2018) Reducing the emission of secondary electrons from materials is critical to improved efficiency and increased performance in high power vacuum electronics. A new mathematical expression for the secondary emission yield (SEY) as a function of the impact voltage up to a maximum of 5 kilovolts is proposed which is an extension of a formula first suggested by Vaughan. The new analytical fit an… Show more

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