A multichannel detector array with 768 pixels developed for electron spectroscopy

Langstaff, D. P.; Chase, Thomas R.

doi:10.1016/j.nima.2006.11.027

Cited by 6 publications

(4 citation statements)

References 3 publications

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“…Xray photoelectron spectroscopy (XPS) measurements were carried out using a Mg Kα x-ray source coupled to a commercial hemispherical analyser (VG CLAM4) modified by incorporation of a direct electron counting array detector developed at Aberystwyth [36]. The current detector has 768 channels distributed over 19 mm of the analyser focal plane, each with independent on-chip discrimination and amplifying electronics [37]. UV photoelectron spectroscopy using He I/He II radiation could also be performed in the same analysis chamber.…”

Section: Methodsmentioning

confidence: 99%

“…The efficient detection system enables conventional high energy resolution spectroscopy to be complemented by real-time measurement of spectral features such as the C 1s core level photoelectron emission peak in snapshot mode. Real-time photoelectron spectroscopy is a relatively recent development that usually relies on intense incident radiation (most studies to data have been carried out at synchrotron light sources) coupled to efficient detectors [37][38][39]. In XPS mode, sufficient quality spectra could be measured in 1 s, a timescale that enables the growth of metal films to be monitored in real time using growth rates of around 0.2 nm min −1 .…”

Section: Methodsmentioning

confidence: 99%

“…Advances in instrumentation (e.g. brighter tuneable light sources, efficient detection [36][37][38][39]) have enabled the technique to be applied in new ways that address many of these limitations (e.g. small area, high energy, high pressure and real time).…”

Section: Experimental Measurement Of Barrier Heightmentioning

confidence: 99%

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Diamond–metal contacts: interface barriers and real-time characterization

Evans

Roberts

Williams

et al. 2009

J. Phys.: Condens. Matter

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A review of diamond-metal contacts is presented with reference to reported values of interfacial potential (Schottky) barriers and their dependence on macroscopic and microscopic properties of the diamond surface, the interface and the metal. No simple model can account for the overall spread of p-diamond barriers, although there are, for certain metals, correlations with metal electronegativity, interface chemistry and diamond surface preparation. Detailed studies are presented for a selected contact (Al-p-diamond) using real-time monitoring during metal growth from sub-nanometre to bulk films and subsequent in situ heating to 1000 °C. This contact, prepared in a clean vacuum environment on characterized single-crystal substrates, provides a case study for a combined in situ electrical and spectroscopic investigation using IV measurements for macroscopic diodes and real-time photoelectron spectroscopy for nanoscale metal films. Band bending during growth leads to a rectifying contact with a measured IV barrier height of 1.05 V and an ideality factor of 1.4. A transition from layered to clustered growth of the metal film is revealed in the real-time measurements and this is confirmed by AFM. For the annealed contact, a direct correlation is revealed by real-time photoemission between the onset of interfacial carbide formation and the change from a rectifying to an ohmic contact at 482 °C.

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Section: Methodsmentioning

confidence: 99%

Section: Methodsmentioning

confidence: 99%

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Diamond–metal contacts: interface barriers and real-time characterization

Evans

Roberts

Williams

et al. 2009

J. Phys.: Condens. Matter

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“…A device has been designed and fabricated using a multi-anode structure on an integrated circuit [1].…”

Section: Introductionmentioning

confidence: 99%

Reduction of multiple triggering in counting detectors

Zhu

Langstaff

2009

Nuclear Instruments and Methods in Physics Research Section A:

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We present a scheme for reducing multiple triggering based on a "first-past-the-post" voting circuit interposed between the sensor amplifier/discriminators and the counters in an event counting detector. We are currently designing a proof on concept circuit to implement the scheme and present simulations and preliminary layout to show how this circuit will operate and integrate with the rest of the detector array.

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Ion Beam Technology

Schmidt

Wetzig

2012

Ion Beams in Materials Processing and Analysis

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A multichannel detector array with 768 pixels developed for electron spectroscopy

Cited by 6 publications

References 3 publications

Diamond–metal contacts: interface barriers and real-time characterization

Diamond–metal contacts: interface barriers and real-time characterization

Reduction of multiple triggering in counting detectors

Ion Beam Technology

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