A Module for BiST of CMOS RF Receivers

Suenaga, K.; Picos, R.; Bota, S.; Roca, M.; Isern, E.; Garcia, EA

doi:10.1007/s10836-007-5051-1

Cited by 3 publications

(2 citation statements)

References 11 publications

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“…Current-based sensors [6,10] or dedicated measurement modules [11,12] have also been employed to measure or predict the performance of some blocks in the receiver chain. All these strategies require connections of the BIT circuitry either to the signal path or to the bias network, and sometimes require the insertion of switches to reconfigure the system under test and to route the RF signal to internal meters in test mode.…”

Section: Introductionmentioning

confidence: 99%

Strategies for built-in characterization testing and performance monitoring of analog RF circuits with temperature measurements

Aldrete-Vidrio

Mateo

Altet

et al. 2010

Meas. Sci. Technol.

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This paper presents two approaches to characterize RF circuits with built-in differential temperature measurements, namely the homodyne and heterodyne methods. Both non-invasive methods are analyzed theoretically and discussed with regard to the respective trade-offs associated with practical off-chip methodologies as well as on-chip measurement scenarios. Strategies are defined to extract the center frequency and 1 dB compression point of a narrow-band LNA operating around 1 GHz. The proposed techniques are experimentally demonstrated using a compact and efficient on-chip temperature sensor for built-in test purposes that has a power consumption of 15 μW and a layout area of 0.005 mm 2 in a 0.25 μm CMOS technology. Validating results from off-chip interferometer-based temperature measurements and conventional electrical characterization results are compared with the on-chip measurements, showing the capability of the techniques to estimate the center frequency and 1 dB compression point of the LNA with errors of approximately 6% and 0.5 dB, respectively.

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Section: Introductionmentioning

confidence: 99%

Strategies for built-in characterization testing and performance monitoring of analog RF circuits with temperature measurements

Aldrete-Vidrio

Mateo

Altet

et al. 2010

Meas. Sci. Technol.

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“…Επιπρόσθετα, η ανάγκη εφαρμογής των σημάτων διέγερσης και εξαγωγής των αποκρίσεων ελέγχου από τα ενδιάμεσα στάδια είναι μία επιπλέον πρόκληση που απαιτεί ειδικές προβλέψεις κατά τη φάση του σχεδιασμού. Εξαιτίας των γεγονότων αυτών, για τον έλεγχο ορθής λειτουργίας έχουν επικρατήσει κατά κόρο οι μεθοδολογίες ανάδρομου βρόχου (loopback test), στις οποίες έχουμε αναφερθεί εκτενώς σε προηγούμενα κεφάλαια [95,128,[161][162][163].…”

Section: στοunclassified

Ανάπτυξη Τεχνικής Για Τον Έλεγχο Ορθής Λειτουργίας Του Τμήματος RF Πομποδεκτών, Προσανατολισμένη Στην Ανίχνευση Ελαττωμάτων

Dermentzoglou¹

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Στα πλαίσια της παρούσας διδακτορικής διατριβής παρουσιάζεται μία νέα τεχνική για τον έλεγχο ορθής λειτουργίας του τμήματος RF ολοκληρωμένων κυκλωμάτων πομποδεκτών. Ο έλεγχος ορθής λειτουργίας είναι προσανατολισμένος στην ανίχνευση ελαττωμάτων των επιμέρους κυκλωμάτων απαρτίζουν τον πομποδέκτη, ενώ η όλη διαδικασία δεν απαιτεί τη χρήση εξωτερικών γεννητριών σημάτων ελέγχου.

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Verifying Functional Specifications by Regression Techniques on Lissajous Test Signatures

Balado

Lupon

Figueras

et al. 2009

IEEE Trans. Circuits Syst. I

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In this paper, a low-cost method to verify functional specifications of analog VLSI circuits is proposed. The method is based on the analysis of Lissajous signatures combined with regression techniques. In order to obtain Lissajous signatures, the observation space is partitioned into zones using hyperplanes, and a set of integer values used as the digital signature of the circuit is generated by Lissajous curve zone crossings. A predictor function obtained by nonlinear regression techniques predicts the functional specification parameters of the circuit under consideration. The viability of this methodology is analyzed and applied to verify the center frequency 0 of a bandpass biquad filter. Experimental measurements show an accurate prediction of the center frequency of the designed filter.

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A Module for BiST of CMOS RF Receivers

Cited by 3 publications

References 11 publications

Strategies for built-in characterization testing and performance monitoring of analog RF circuits with temperature measurements

Strategies for built-in characterization testing and performance monitoring of analog RF circuits with temperature measurements

Ανάπτυξη Τεχνικής Για Τον Έλεγχο Ορθής Λειτουργίας Του Τμήματος RF Πομποδεκτών, Προσανατολισμένη Στην Ανίχνευση Ελαττωμάτων

Verifying Functional Specifications by Regression Techniques on Lissajous Test Signatures

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