1992
DOI: 10.1016/0883-2889(92)90241-6
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A modification of the emission—transmission method for the determination of trace and minor elements by XRF

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Cited by 14 publications
(9 citation statements)
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“…The oldest correction method for quantification of the intermediate thickness samples is the emission-transmission (E-T) method in which the absorption properties of the sample are determined experimentally using a multielement target and then applied to calculate the absorption correction factors [18]. Some problems exist in the analysis of heterogeneous samples [19] and samples containing minor and major elements [20,21]. Another group of correction methods are based on scattered primary radiation.…”
Section: Quantification Of Intermediate Thickness Samplesmentioning
confidence: 99%
“…The oldest correction method for quantification of the intermediate thickness samples is the emission-transmission (E-T) method in which the absorption properties of the sample are determined experimentally using a multielement target and then applied to calculate the absorption correction factors [18]. Some problems exist in the analysis of heterogeneous samples [19] and samples containing minor and major elements [20,21]. Another group of correction methods are based on scattered primary radiation.…”
Section: Quantification Of Intermediate Thickness Samplesmentioning
confidence: 99%
“…If minor and/or major elements are present in a sample, discontinuities in the relationship between µ s (λ,λ i ) and wavelength resulting from absorption edges are observed. Then, at least two measurements for each wavelength region are performed or appropriate iteration procedure can be applied [104]. The serious advantage of the E-T method is the possibility of determining of the total mass-attenuation coefficient µ s (λ,λ i ) without the knowledge …”
Section: Matrix Correction Methods Based On X-ray Transmission Measurementioning
confidence: 99%
“…In particular, high accuracy, precision, versatility, sensitivity, and advanced standard‐less calibration strategies make WDXRF an excellent technique for the quick analysis of major, minor, and trace elements. [ 61–68 ] In addition, the use of the analyzing crystals such as LiF (200) and PET (002), it is quite easy to detect lighter elements (low Z) more accurately and precisely. Recently, WDXRF spectroscopy has been used to investigate the elemental changes in the nematode‐infested roots of papaya plants and okra plants.…”
Section: Quantitative Analysis Of Plant Materials Using Xrfmentioning
confidence: 99%
“…[ 62 ] It is based on the measurement of the X‐ray beam from the test sample alone. [ 63,64 ] It is a very efficient technique for the correction of matrix absorption effects in the XRF analysis of the test samples of intermediate thickness. [ 64 ] Its relative simplicity and versatility are supplemented by good accuracy, particularly in trace element analysis.…”
Section: Quantitative Analysis Of Plant Materials Using Xrfmentioning
confidence: 99%
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