2009
DOI: 10.1016/j.sab.2009.09.005
|View full text |Cite
|
Sign up to set email alerts
|

Quantitative X-ray fluorescence analysis of samples of less than ‘infinite thickness’: Difficulties and possibilities

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

0
66
0

Year Published

2011
2011
2024
2024

Publication Types

Select...
7
1
1

Relationship

0
9

Authors

Journals

citations
Cited by 87 publications
(71 citation statements)
references
References 114 publications
0
66
0
Order By: Relevance
“…The overview of fundamental parameter methods applied in analysis of thin films and multilayers can be found in Ref. (Sitko, 2009). The fundamental parameter methods have some limitations.…”
Section: Fundamental Parameter Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…The overview of fundamental parameter methods applied in analysis of thin films and multilayers can be found in Ref. (Sitko, 2009). The fundamental parameter methods have some limitations.…”
Section: Fundamental Parameter Methodsmentioning
confidence: 99%
“…Review of quantitative analysis of these samples including many references can be found in Ref. (Markowicz and Van Grieken, 2002;Sitko, 2009). The general division of the sample in X-ray fluorescence analysis is presented in Fig.…”
Section: General Relationship Between Radiation Intensity and Concentmentioning
confidence: 99%
“…2). The XRF signal ratios generally are proportional to the concentration ratios of elements in the solid phase provided that the thickness of the sample is sufficient [50]. Therefore, the XRF ratio for K/S combined with the presence of a single ALuS 2 phase directly provides the information about potassium (and indirectly also about sodium) content in this sulfide.…”
Section: Structural Properties and Elemental Compositionmentioning
confidence: 99%
“…The various approaches to the XRF quantitative analysis of biological, environmental, and geological samples were discussed previously and can be found elsewhere. [25][26][27][28][29] An overview of quantification methods in energy-dispersive XRF analysis was presented by Markowicz. [30] Specimens for the XRF analysis can be prepared according to various procedures.…”
Section: Introductionmentioning
confidence: 99%