2007
DOI: 10.1088/0960-1317/17/3/005
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A method to extract the lateral and normal components of motion from the capacitance change of a moving MEMS comb drive

Abstract: MEMS comb drives made in surface micromachining can suffer from a parasitic out-of-plane motion (levitation) in addition to the intended lateral motion. We have developed a model that accurately describes the capacitance changes of an actuated comb drive that suffers from levitation. We show that the model can be used to very accurately extract the lateral motion as a function of actuation voltage. This enables us to use the comb drive as a position sensor with very high accuracy, which does not suffer from le… Show more

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Cited by 12 publications
(19 citation statements)
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“…3 and ref. [34]) shows that at low voltages significant out-of plane motion occurs, saturating at an equilibrium height approximately 0.5 lm above the rest position. By not operating the device around a lateral actuation voltage of 0 V, but working in the offset window of 40-80 V, where the levitation has already reached its saturation height, the out-of-plane motion cannot influence the measurement anymore.…”
Section: Methods To Measure Friction Loopsmentioning
confidence: 98%
See 1 more Smart Citation
“…3 and ref. [34]) shows that at low voltages significant out-of plane motion occurs, saturating at an equilibrium height approximately 0.5 lm above the rest position. By not operating the device around a lateral actuation voltage of 0 V, but working in the offset window of 40-80 V, where the levitation has already reached its saturation height, the out-of-plane motion cannot influence the measurement anymore.…”
Section: Methods To Measure Friction Loopsmentioning
confidence: 98%
“…This out-of-plane motion influences the capacitance readings and also causes the device to move upward significantly as well as sideways, at low actuation voltages. We have developed an analytical model to extract from the motion-related capacitance change both the in-plane and out-of-plane component [34].…”
Section: Devicementioning
confidence: 99%
“…While the frequency is varied to be away from the resonance frequency of the fingers, the error in the capacitance measurement due to the limitation of the impedance analyzer becomes higher. The other reason may be because of parasitic displacement in the unintended direction at the out-of-plane direction [6]. The C-V behaviors of the sensors require further research.…”
Section: Electromechanical Characterizationsmentioning
confidence: 99%
“…structure deforms and therefore change the electrostatic force distribution, resulting in a complex electromechanical coupling of the devices and inducing non-linearity in electrostatic forces ultimately leading to a pull in stage. Many researchers often estimate the capacitance and electric forces by some analytical models for simple geometries (Engelen et al 2010;van Spengen and Heeres 2007;van Spengen and Oosterkamp 2007). In these models, the geometric simplicity is used to justify the assumption that some parts of the electric field can be neglected and/or it is uniform elsewhere.…”
Section: Introductionmentioning
confidence: 99%