A Large Scale, Flip-Flop RAM imitating a logic LSI for fast development of process technology

Fujii, M.; Nii, Koji; Makino, Hiroshi; Ohbayashi, S.; Igarashi, M.; Kawamura, Takeshi; Yokota, Michio; Tsuda, Nobuhiro; Yoshizawa, T.; Tsutsui, Toshikazu; Takeshita, N.; Murata, Naofumi; Tanaka, Tomohiro; Fujiwara, T.; Asahina, K.; Okada, Michiyo; Tomita, Kazuo; Takeuchi, Masahiko; Shinohara, Hirofumi

doi:10.1109/icmts.2007.374469

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Cited by 9 publications

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“…The semiconductor industry has adopted a solution based on test chips [1] to evaluate process variation. The SRAM are well known to be a good vehicle to detect hard defects [2][3][4]. In the same way Ring Oscillators (RO) [5][6][7] are widely used to characterize process variation.…”

Section: Introductionmentioning

confidence: 99%