“…The overview of the test structure is given using a bottom up approach from the architecture of the elementary cell up to the description of the entire chip [8]. The test structure is designed in a CMOS 130 nm technology of ST-Microelectronics.…”
“…The overview of the test structure is given using a bottom up approach from the architecture of the elementary cell up to the description of the entire chip [8]. The test structure is designed in a CMOS 130 nm technology of ST-Microelectronics.…”
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