1999
DOI: 10.3169/itej.53.142
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A High-voltage MOSFET Applicable to a Highly Sensitive Solid-state Imager.

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Cited by 4 publications
(3 citation statements)
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“…We have been developing films with low-voltage signal-current multiplication to increase the sensitivity of visible-light image sensors using avalanche multiplication phenomena [4]. Avalanche multiplication usually requires a high electric field of ∼10 6 V/m, which is a problem because the withstand voltage of an imaging device readout circuit is generally less than several dozen volts [5,6]. The attainment of the required electric field with low applied voltage necessitates a reduction in the photoconductive film's thickness to a few microns.…”
Section: Introductionmentioning
confidence: 99%
“…We have been developing films with low-voltage signal-current multiplication to increase the sensitivity of visible-light image sensors using avalanche multiplication phenomena [4]. Avalanche multiplication usually requires a high electric field of ∼10 6 V/m, which is a problem because the withstand voltage of an imaging device readout circuit is generally less than several dozen volts [5,6]. The attainment of the required electric field with low applied voltage necessitates a reduction in the photoconductive film's thickness to a few microns.…”
Section: Introductionmentioning
confidence: 99%
“…Since the high-sensitivity mode requires electric field of 80–100 V/μm across the a-Se film [ 1 , 5 , 6 ], the operation voltage of a-Se FPDs are typically 1–1.5 kV. Such a high voltage often leads to breakdown of FET gate [ 24 ], as well as irreversible breakdown of a-Se layer due to a local field enhancement at the edge of metal electrode [ 25 , 26 ]. The local electric field can be reduced by introducing resistive interface layer, however, it sacrifices carrier transport property.…”
Section: Introductionmentioning
confidence: 99%
“…Combined with silicon thin-film transistor technology, this device enabled pixelated imaging with X-ray energy suitable for medical inspection. The next step should be a-Sebased high-sensitivity X-ray detector, however, the carrier multiplication could not simply be applied in a direct-conversion flat panel detector: high operation voltage required for carrier multiplication led to unexpected breakdown at the contact or thin-film transistor-based signal read-out [4][5][6]. For this reason, a-Se-based vacuum devices with electron beam read-out are attracting much attention.…”
Section: Introductionmentioning
confidence: 99%