2000
DOI: 10.1109/84.825778
|View full text |Cite
|
Sign up to set email alerts
|

A high-performance planar piezoresistive accelerometer

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
2

Citation Types

0
90
0

Year Published

2003
2003
2021
2021

Publication Types

Select...
3
3
2

Relationship

0
8

Authors

Journals

citations
Cited by 168 publications
(93 citation statements)
references
References 15 publications
0
90
0
Order By: Relevance
“…The first source, termed Johnson noise, represents random noise derived from the thermal properties of a resistor (Senturia 2001). Johnson noise is constant over all frequencies and is theoretically estimated to be 7 nV for the piezoresistors implanted in the accelerometer's flexural element (Partridge et al 2000). The second noise source, termed Hooge noise, is inversely proportional to frequency.…”
Section: Piezoresistive Accelerometer Validationmentioning
confidence: 99%
See 1 more Smart Citation
“…The first source, termed Johnson noise, represents random noise derived from the thermal properties of a resistor (Senturia 2001). Johnson noise is constant over all frequencies and is theoretically estimated to be 7 nV for the piezoresistors implanted in the accelerometer's flexural element (Partridge et al 2000). The second noise source, termed Hooge noise, is inversely proportional to frequency.…”
Section: Piezoresistive Accelerometer Validationmentioning
confidence: 99%
“…Departing from the Roylance design, a lateral in-plane accelerometer that can exploit the use of DRIE fabrication techniques is examined (Partridge et al 2000). The design of the planar accelerometer is straightforward.…”
Section: Design Of a Piezoresistive Accelerometermentioning
confidence: 99%
“…Rajaraman et al developed a highly sensitive flexible piezoresistive sensor, which can be used to sense vibration with a full scale acceleration range of 2g. 16,17 An acceleration sensor with sensing axis in the plane of a wafer also has been proposed by Partridge et al 18,19 They used a DRIE to form arbitrarily sharp planar flexures with vertical sidewalls. Oblique incidence ion implantation was used to dope the piezoresistors on the sidewalls of the etched structures.…”
Section: Introductionmentioning
confidence: 99%
“…Microcantilevers have been utilized in many other applications besides gas sensing such as atomic-force microscopes (AFM) (Albrecht, 1990), accelerometers (Kim, 1995), etc. The majority of microcantilevers fabricated, to date, use a symmetric geometry for the base of the cantilever beam (Su, 2003;Lavrik, 2004;Xu, 2006;Lee, 2003) and a piezoresistive or piezoelectric sensing element (Partridge, 2000;Wang, 2003). For example, previous work by our group involved the fabrication of a T-shaped piezoresistive sensing element at the base of the cantilever for performing gas composition analysis (Xu, 2006).…”
Section: Introductionmentioning
confidence: 99%
“…The resonant frequency of the microresonator can be measured through electronic circuitry using the piezoelectric effect (Wang, 2003) or the piezoresistive effect (Partridge, 2000), and can also be measured optically using a laser focused on the vibrating structure (Gupta, 2004).…”
Section: Introductionmentioning
confidence: 99%