1996
DOI: 10.1109/84.536623
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A hermetic glass-silicon micropackage with high-density on-chip feedthroughs for sensors and actuators

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Cited by 115 publications
(41 citation statements)
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“…where A f is the accelerated factor, which is widely used by Eq. (1.10) under high temperature and high humidity soaks testing [33].…”
Section: Methodsmentioning
confidence: 99%
“…where A f is the accelerated factor, which is widely used by Eq. (1.10) under high temperature and high humidity soaks testing [33].…”
Section: Methodsmentioning
confidence: 99%
“…4, is fabricated at a commercial foundry from an Al layer with a line and space of 5 m. The leakage current monitor is encapsulated at the wafer level so that ALD surface coatings can be added directly on the WLE to act as a barrier to moisture. This approach to validate the WLE has been previously used to examine thin film [74,77] and wafer bonded [75,76] encapsulation schemes.…”
Section: Leakage Current Assessmentmentioning
confidence: 99%
“…The interdigitated structure has traditionally enabled dew point detection during plastic package qualification [71][72][73]. After calibration in a temperature-and moisture-controlled environment, the same structure may function as a humidity sensor, whether encapsulated by a permeable polymeric layer [74] or direct exposed to the environment [75,76]. In the direct ambient, monolayers of water at the surface may facilitate electric current.…”
Section: Leakage Current Assessmentmentioning
confidence: 99%
“…Anodic bonding [30] has been widely used for protecting on-board electronics in biosensors [31,32] and sealing cavities in pressure sensors [33], which offers a bonding temperature of about 200-400 • C and requires the aid of a high electrical field in the region of 700-2000 V to achieve high-quality bonds. The high voltage used in the anodic bonding has great influence on the integrate circuits on the silicon wafer.…”
Section: Introductionmentioning
confidence: 99%