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2020
DOI: 10.1002/marc.202000600
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A Fluorinated Thermocrosslinkable Organosiloxane: A New Low‐k Material at High Frequency with Low Water Uptake

Abstract: In order to obtain low‐k material with good comprehensive properties, a trifluoromethyl‐containing organosiloxane with thermocrosslinkable vinyl and benzocyclobutene groups is designed and synthesized through the Piers–Rubinsztajn reaction. After treating at high temperature, the organosiloxane changed to form a cross‐linked polysiloxane (called as c‐FSi‐BCB). c‐FSi‐BCB exhibits good dielectric properties with dielectric constant (Dk) of 2.60 and dielectric loss (Df) of 1.49 × 10−3 at a high frequency of 5 GHz… Show more

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Cited by 40 publications
(57 citation statements)
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“…The best k value (1.83 for c ‐T 12 B 12 ) obtained here is much lower than current state‐of‐the‐art low‐ k dielectric (i.e., porous SiCOH, k = 2.4) and recently reported low‐ k materials such as fluoropolymers, [ 18,65,66 ] modified polyimide, [ 19 ] MOFs, [ 25,26,67 ] and siloxane containing hybrid materials [ 17,68–70 ] (Table S3, Supporting Information). Although some porous organosilicas have extremely low‐ k values (≈1.7), [ 14,15 ] their further applications are limited by the inferior thermal stability (T d5 < 300 °C) and mesopore (too large pores will allow for metal diffusion through the dielectrics and result in short‐circuiting).…”
Section: Resultsmentioning
confidence: 57%
“…The best k value (1.83 for c ‐T 12 B 12 ) obtained here is much lower than current state‐of‐the‐art low‐ k dielectric (i.e., porous SiCOH, k = 2.4) and recently reported low‐ k materials such as fluoropolymers, [ 18,65,66 ] modified polyimide, [ 19 ] MOFs, [ 25,26,67 ] and siloxane containing hybrid materials [ 17,68–70 ] (Table S3, Supporting Information). Although some porous organosilicas have extremely low‐ k values (≈1.7), [ 14,15 ] their further applications are limited by the inferior thermal stability (T d5 < 300 °C) and mesopore (too large pores will allow for metal diffusion through the dielectrics and result in short‐circuiting).…”
Section: Resultsmentioning
confidence: 57%
“…With the rapid advent of the fifth-generation (5G) mobile communication era, the fast development of large-scale integrated circuits has created an urgent demand for the high performance of interlayer media [1]. However, the resistance-capacitance time delay, the crosstalk noise between lines, and the power dissipation in devices have become the primary bottlenecks in integrated circuit development [2,3]. Therefore, there is a great demand for low dielectric materials as insulating interlayers with good thermal resistance, low water absorption, and excellent mechanical properties for microelectronics.…”
Section: Introductionmentioning
confidence: 99%
“…10 Some materials have a low-k, but their mechanical and thermodynamic properties are not excellent, so their use value is limited. 11,12 Another way is to significantly reduce the k via low-polarity bonds, such as Si C, 13,14 C C, 15,16 C F, 17 and so forth. Compared with other low-k materials, the materials based on carbon-silicon structure can significantly reduce the k and dielectric loss.…”
Section: Introductionmentioning
confidence: 99%