A flexible statistical model for CAD of submicrometer analog CMOS integrated circuits

Michael, C.; Abel, C.; Teng, C.S.

doi:10.1109/iccad.1993.580077

Cited by 9 publications

(1 citation statement)

References 7 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…In particular device mismatch, that is the effect that c a w s a dependence of correlation among parameters of identical d e vicea on their mutual distances, is responsible for the performance degradation of circuits requiring an accurate device matching to work properly [2, 6,12]. Well-known examples of such circuits are digital-banalog and analog-&digital converters, as well as phamlocked-loops, mixers, VCOs, bandgap references, sense-amplifiers and so on.…”

Section: Introductionmentioning

confidence: 99%

SiSMA: a statistical simulator for mismatch analysis of MOS ICs

Biagetti¹,

Orcioni²,

Signoracci³

et al.

IEEE/ACM International Conference on Computer Aided Design, 2002. ICCAD 2002.

View full text Add to dashboard Cite

This paper preenta a simulator for the statistical analysis of MOS integrated circuita affected hy mismatch effect. The tool is based on a rigorous formulation of circuit equations including random current murces to take into account technological toleran-. The simulator requires a simulation time of several orders of magnitude lower than that required by Montecarlo analysis, while ensuring a good accuracy. K e y w O r d sDevice mismatch, stochastic simulation, MNA, MOS ICs, nonMontecarlo analysis.

show abstract

Section: Introductionmentioning

confidence: 99%