A Dual Low Power 1/2 LSB NL 16b/1Msample/s SAR A/D Converter with on-chip Microcontroller

Leung, Ka; Holberg, Douglas R.

doi:10.1109/asscc.2006.357849

Cited by 3 publications

(2 citation statements)

References 3 publications

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“…A PCDM structure is chosen to improve the linearity of the MOS capacitor [12] . The upper part is a conventional bootstrapped switch [13] . The lower part is a PMOS bootstrapped switch.…”

Section: The Bootstrapped Switchmentioning

confidence: 99%

High-resolution 1 MS/s sub-2 radix split-capacitor SAR ADC

Cao

Zhu

2017

J. Semicond.

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This paper proposes a high-resolution successive-approximation register (SAR) analog-to-digital converter (ADC) with sub-2 radix split-capacitor array architecture. The built-in redundancy of sub-2 radix architecture provides additional information in the digital calibration based on offset double injection. The calibration method is simple in structure and fast in convergence. The correction of errors in each bit is independent of those in the previous bit. A split-capacitor array is used to reduce the total capacitance especially in a high-resolution SAR ADC. An offset signal is injected by the switching scheme of capacitor array to minimize the hardware overhead. The prototype of 0.18 μm CMOS process obtains 14.46 bit ENOB and 95.65 dB SFDR after calibration. With calibration, the INL and DNL are −0.813/0.938 and −0.625/0.688, respectively.

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“…A PCDM structure is chosen to improve the linearity of the MOS capacitor [12] . The upper part is a conventional bootstrapped switch [13] . The lower part is a PMOS bootstrapped switch.…”

Section: The Bootstrapped Switchmentioning

confidence: 99%

High-resolution 1 MS/s sub-2 radix split-capacitor SAR ADC

Cao

Zhu

2017

J. Semicond.

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“…Most current microcontrollers (MCU) are equipped with internal analog-to-digital converters (ADC). The used type of ADC is usually the Successive Approximation Register (SAR) architecture [1]. MCU with SAR ADC is very often used in measuring applications, where they are used for digitization of DC or quasi-static voltages.…”

Section: Introductionmentioning

confidence: 99%

Increasing of Sampling Rate of Internal ADC in Microcontrollers by Equivalent-Time Sampling

Svatoš¹,

Fischer²,

Holub³

2022

Proceedings of the 25th IMEKO TC4 International Symposium and 23rd International Workshop on ADC and DAC Modelling and Testing

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The paper describes the Equivalent-Time Sampling (ETS) in Software-Defined Instruments (SDI) -typically oscilloscopes. It introduces a possible solution of the microcontrollers drawback caused by the maximal sampling frequency and its limitations in digitizing quick transient responses. The principle of ETS used in microcontrollers is explained, and the jitter effect is taken into account. Analog-to-digital converter input model and real properties of softwaredefined oscilloscope from ETS point of view are introduced and explained. In the system for circuit behavior analysis as a step response, where a microcontroller with internal peripherals (pulse-width modulation and analog-to-digital converter) is used for a test signal generation and data digitization, the use of ETS may increase the equivalent sampling rate of the internal analog-to-digital converter up to tens of MSa/s.

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